Time-resolved polycrystalline x-ray diffraction target device

Abstract

The invention relates to the technical field of powder crystal X-ray diffraction diagnosis, and discloses a time-resolved polycrystalline X-ray diffraction target device. Thetime-resolved polycrystalline X-ray diffraction target device comprises: a backlight X-ray target assembly used for generating pulse X-rays for carrying out transient X-ray diffraction diagnosis on a polycrystalline target at different time sequences; a laser-driven loading target assembly which is used for simulating the impact compression process generated in the high-speed impact or detonation process of the polycrystalline target, wherein at least one diffraction hole is formed in the laser-driven loading target assembly; an X-ray shielding assembly which is used for shielding the pulse X-rays which do not enter the diffraction hole and the pulse X-rays which enter the diffraction hole; an X-ray imaging assembly which is used for imaging the pulse X-rays entering the diffraction hole, wherein the X-ray imaging assembly is provided with an optical imaging channel; and a focusing and aiming assembly which is used for performing optical imaging on the polycrystalline target through the optical imaging path and the diffraction hole. The device has the characteristics of high time sequence synchronization precision and good time resolution, and is sensitive to the change of a microstructure of an atomic scale.

Description

technical field [0001] The invention relates to the technical field of powder crystal X-ray diffraction diagnosis, in particular to a time-resolved polycrystalline X-ray diffraction target device. Background technique [0002] During high-speed impact or detonation, the internal microscopic atomic structure of some powder crystal materials will be rearranged, that is, a structural phase change will occur, which will cause physical (such as strength and other mechanical properties, transparency, etc.) of the powder crystal (metal or ceramic) material itself. Optical properties, electrical properties such as electrical conductivity, etc.) and chemical properties undergo drastic changes, which further affect the development of the subsequent shock or detonation process. [0003] For example, in the fields of explosive mechanics and armor protection, it is particularly important to determine the physical moment when the powder crystal phase transition occurs and the microscopic ...

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Problems solved by technology

[0003] For example, in the fields of explosive mechanics and armor protection, it is particularly important to determine the physical moment when the powder crystal phase transition occurs and the microscopic phase structure characteristics of the powder crystal material before and after this time, which requires the diagnosis of the microstructure phase of the powder crystal under extreme conditions such as impact. However, there is no good technology to realize process diagnosis at present. There are generally defects such as low diagnostic accuracy, insensitivity to structural changes, multiple measurements, low timing synchronization accuracy, and poor time resolution.

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