Method for measuring width of diffusion overlapping area of optical camouflage paint film
A technology of overlapping areas and measurement methods, applied in the field of measurement, can solve the problems of inability to quantitatively measure, differences, etc., and achieve the effect of overcoming differences and inability to quantitatively measure
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[0013] The technical solution of the present invention will be further described in detail below in conjunction with the accompanying drawings.
[0014] The invention discloses a method for measuring the width of an optical camouflage paint film diffusion overlapping area, and the specific steps are as follows:
[0015] The light source emitted from the standard white light source scans vertically through the junction area of the two color blocks A and B of the optical camouflage paint film at a uniform speed. When the emitted white light is in the two color block areas of the A color block and the B color block, the wavelengths of the reflected light correspond to the wavelengths of the two color block colors, and the white light is emitted in the two optical camouflage paints of the A color block and the B color block. When scanning in the overlapping area of film diffusion, the wavelength of the reflected light changes from the wavelength of the two color blocks A and B...
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