Pin detection device for testing integrated circuit board

Abstract

The invention provides a pin detection device for testing an integrated circuit board, which relates to the field of integrated circuit boards. The pin detection device for testing the integrated circuit board comprises a contact sleeve, the surface of the contact sleeve is in threaded connection with an extension pipe, the upper end of the extension pipe is fixedly connected with a guide ring, the upper end of the guide ring is fixedly connected with a rail breaking ring, the outer side of the rail breaking ring is rotationally connected with a rotating ring, an inner groove of the rail breaking ring is in sliding connection with a force exerting plate, the ends, away from each other, of the force exerting plates are fixedly connected with limiting blocks, the limiting blocks are slidably connected with the broken rail ring, and the sides, away from each other, of the limiting blocks are fixedly connected with contraction springs. According to the pin detection device for testing the integrated circuit board, the contact sleeve is in direct contact with the circuit board to prevent external metal from generating static electricity to break down the circuit board, the lengths of the pins are controlled through the extension pipe, the lengths of the welding pins of the circuit board can be unified, and the effect of preventing static electricity generated by contact is achieved, and the problems that pins are different in length and static electricity is generated during cutting to break down an integrated circuit board are solved.

Description

technical field [0001] The invention relates to the field of integrated circuit boards, in particular to a pin detection device for testing integrated circuit boards. Background technique [0002] An integrated circuit is a tiny electronic device or component. Using a certain process, the transistors, resistors, capacitors, inductors and other components required in a circuit are interconnected, and they are fabricated on a small or several small semiconductor wafers or dielectric substrates, and then packaged in a tube. , to become a microstructure circuit with the desired circuit function. [0003] At present, the pins of integrated circuit boards are divided into patch type and lead type. Lead type pins are often used because of their reliable connection and low price. When the integrated circuit board assembly test pins are uniformly cut, it is easy to cause inconsistent cutting and shearing. Therefore, a device for uniformly cutting pins that prevents solder joints fr...

AI Technical Summary

Problems solved by technology

[0004] Aiming at the deficiencies of the prior art, the present invention provides a pin detection device for integrated circuit board testing, which solves the problem of uneven pin lengths and electrostatic breakdown of integrated circuit boards during cutting, and pins are damaged by pressure shaking during cutting. Solder joints and pins are densely packed and cannot be cut separately

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