Automatic driving test method and device, electronic equipment and storage medium

Abstract

The invention discloses an automatic driving test method and device, electronic equipment and a storage medium, and the method comprises the steps: forming each test path through each pair of test points, and according to the current test point of a vehicle, obtaining a test path of each test path formed by each pair of test points from a data table recording each test path formed by each pair of test points; and searching a target test path which takes the current test point as a test starting point and has the minimum number of automatic driving tests, carrying out automatic driving tests on the vehicle, and updating the number of automatic driving tests of the target test path. Therefore, during each automatic driving test, only the target test path which is formed by only two test points and has the least driving test frequency needs to be searched, and the shortest test path does not need to be pre-generated according to a plurality of test points, so that the pushed target test path is more diversified, the coverage rate of the test path is improved, and the test efficiency is improved. Therefore, the testing efficiency of automatic driving is improved.

Description

technical field [0001] The present application relates to the technical field of data processing, and in particular to a test method, device, electronic equipment and storage medium for automatic driving. Background technique [0002] In the field of autonomous driving, in order to improve the safety of autonomous driving, it is usually necessary to test the driving of autonomous vehicles on various routes in the operating area. [0003] In related technologies, all test points in the operating area will be pre-generated based on k-shortest path (K-shortest path) pathfinding, bidirectional Dijkstra (bidirectional Dijkstra) algorithm or other path algorithms to generate the shortest path tree, Then, by setting the search threshold, multiple test paths are formed to test the automatic driving of the vehicle. [0004] However, the autonomous driving test is carried out through the shortest test path generated by all test points in advance, and the planned path obtained is rela...

AI Technical Summary

Problems solved by technology

[0004] However, through the shortest test path generated by all test points in advance for autonomous driving testing, the planned path obtained is relatively single and the route coverage is poor

And when it is necessary to adjust the starting point of the vehicle or delete a certain test point during the automatic driving test, the vehicle will not be able to conduct the automatic driving test according to the originally set test path, which will affect the test efficiency of the automatic driving

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