Method and system for chip inspection and tracking

Abstract

The invention discloses a chip inspection and tracking method and system, which relate to the technical field of chip detection and include a data upload module, a parameter detection module, an equipment tracking module and several chips; when the parameter detection module detects multiple chips in batches, the data upload module uses When the inspector uploads the detection request to the host computer, the host computer is used to distribute several detection task data packets to different detection units, so as to realize the diverse combination of detection tasks and improve detection efficiency; the detection unit is used to analyze the received detection The content of the task data package executes several detection tasks set in the detection task data package in sequence according to the detection value, and sends the detection data to the host computer; the equipment tracking module is used to obtain the detection data with the same equipment identification for equipment tracking analysis, Determine whether the corresponding equipment has a tendency to produce unqualified chips, so as to remind the management personnel to overhaul the equipment, thereby improving the chip quality and pass rate.

Description

technical field [0001] The invention relates to the technical field of chip inspection, in particular to a chip inspection and tracking method and system. Background technique [0002] With the enhancement of the application range and functional characteristics of the chip, the chip has been widely used in more and more fields, such as industry, aerospace, military or automobile ships; Functional parameters are tested, such as communication, timing and electrical working parameters (such as high voltage current, contact resistance, insulation resistance, dielectric strength, etc.); [0003] Both the test part and the system control part of the existing chip production test method are executed by a controller. However, with the improvement of the automation degree of the chip test method, the current chip test system can not meet the requirements of the mass production test process of the chip. Operating pressure leads to low detection efficiency, which is not conducive to p...

AI Technical Summary

Problems solved by technology

[0003] Both the test part and the system control part of the existing chip production test method are executed by a controller. However, with the improvement of the automation degree of the chip test method, the current chip test system can not meet the requirements of the mass production test process of the chip. Operating pressure leads to low detection efficiency, which is not conducive to product modification and upgrading. In addition, the detection task of detecting chip-related functional parameters cannot be customized according to requirements or for different chips, so that the detection task cannot be realized. Diversified combinations make it impossible to efficiently and accurately cooperate with the quality control platform for statistical collection, quality control analysis and tracking of chip production data, etc.

Images