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An automatic detection mechanism for s-parameters of radio frequency chip load

An automatic detection and load belt technology, applied in packaging, sorting and other directions, can solve problems such as incorrect polarity identification and failure to reach high-end manufacturing fields, and achieve production and processing efficiency, high practical value and promotion value, guarantee. Adsorption stabilization effect

Active Publication Date: 2022-04-26
SICHUAN YONGXING ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This method has the risk of incorrect polarity identification. At the same time, the S parameter is used as the core technical index of the RF chip load, which requires 100% testing to ensure the high reliability of the index. It is far from high-end manufacturing only through random testing and manufacturing processes. field requirements

Method used

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  • An automatic detection mechanism for s-parameters of radio frequency chip load
  • An automatic detection mechanism for s-parameters of radio frequency chip load
  • An automatic detection mechanism for s-parameters of radio frequency chip load

Examples

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Embodiment

[0036] Such as Figure 1 to Figure 17 As shown, this embodiment provides an automatic detection mechanism for the S-parameters of the radio-frequency chip load, which belongs to a part of the test device for the S-parameters of the radio-frequency chip load. First of all, it should be noted that the serial numbers such as "first" and "second" in this embodiment are only used to distinguish similar components, and should not be understood as specific limitations on the scope of protection. In addition, directional terms such as "bottom", "top", and "surrounding edge" in this embodiment are described based on the drawings.

[0037] In this embodiment, the device for testing the S parameters of the radio frequency chip load belt includes: a workbench 1 , a feeding tray 2 , a turret detection mechanism 3 and a packaging mechanism 4 . Wherein, a worktable surface 30 is arranged on the workbench 1 .

[0038] Such as Figure 1 to Figure 12 As shown, the turret detection mechanism ...

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Abstract

The invention discloses an automatic detection mechanism for S parameters of a radio frequency chip load, which belongs to the technical field of radio frequency chip load detection, and comprises a workbench; The loading of the tray and the polarity identification and S-parameter measurement of the radio frequency chip load; the industrial computer is set on the workbench and is electrically controlled with the feeding tray and the turret detection mechanism; the turret detection mechanism includes rotation and The turret module is set on the workbench, and the first positioning module, the second positioning module, the reversing module, the third positioning module, the shaping and changing module are arranged in sequence along the rotation direction of the turret module Orientation module, test module and the fourth positioning module, the downward looking CCD module set corresponding to the first positioning module, the second positioning module and the reversing module one by one, and being arranged on the workbench, and Blowing modules corresponding to the second positioning module and the third positioning module.

Description

technical field [0001] The invention relates to the technical field of radio frequency chip load detection, in particular to an automatic detection mechanism for S parameters of a radio frequency chip load. Background technique [0002] As a special type of product among chip resistors, radio frequency chip loads are mainly used in radar, communication, radio frequency modules and other fields. With the development of scientific information technology and the full deployment of 5G communication technology, the demand for miniaturization in aerospace communication and other fields has increased, and the demand for radio frequency chip loads is increasing. The difference between the RF chip load and the conventional chip resistor is that the bottom electrode of the RF chip load is asymmetrical and has polar components. The bottom electrode of the RF chip load needs to correspond to the polarity mark on the front. However, the conventional chip resistor testing and packaging t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): B65B15/04B65B35/38B07C5/36
CPCB65B15/04B65B35/38B07C5/36B07C5/363
Inventor 王元宇许春宁杜攀张琳琪
Owner SICHUAN YONGXING ELECTRONICS