Low-frequency digital-analog hybrid module clock structure and scan chain design method
A digital-analog hybrid and design method technology, applied in computer-aided design, CAD circuit design, calculation, etc., to achieve the effect of reducing quantity, low instantaneous power consumption, and saving area
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Embodiment 2
[0034] like figure 2 As shown, the embodiment of the present invention provides a method for designing a clock structure of a low-frequency digital-analog hybrid module, including the following steps:
[0035] S101: Determine the maximum number of registers that can be fanned out under different drive units;
[0036] Specifically, the load capacity of the drive unit is the sum of the loads (that is, capacitance) of the next stage, and the greater the load capacity, the more fanouts the drive unit can be connected to. In different process environments, the fan-out assignment of the drive unit is different. There are capacitor lists for the output ports of different drive units in the process library, and the fan-out quantity can be judged through the capacitor list. In the design, in order to maintain the stability of the process, an intermediate value is selected as the fan-out assignment of the drive unit.
[0037] At the same time, the fan-out assignment of the drive unit...
Embodiment 3
[0045] like image 3 As shown, the embodiment of the present invention provides a method for designing a scan chain of a low-frequency digital-analog hybrid module, including the following steps:
[0046] S201: Analyze timing problems caused by the clock structure of the low-frequency digital-analog hybrid module, and determine a scan chain connection sequence that is most conducive to promoting timing convergence of the low-frequency digital-analog hybrid module;
[0047] S202: For each register of each register group, interrupt the connection between the SI terminal of the register and the Q terminal of the previous stage register to which it is connected;
[0048] S203: For each register of each register group, according to the scan chain connection order determined in step S201, connect the SI terminal of the register with the D terminal of the register of the preceding stage that differs by at least one first clock buffer unit in delay time , and keep the original connec...
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