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Chip test system

A chip testing, chip technology, applied in the direction of electronic circuit testing, etc., can solve the problems of incomplete test data, single function of chip test equipment, etc., to achieve the effect of overcoming incomplete test data, multiple functions, and high degree of automation

Active Publication Date: 2022-04-05
WUHAN RAYCUS FIBER LASER TECHNOLOGY CO LTD
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AI Technical Summary

Problems solved by technology

[0003] The embodiment of the present application provides a chip testing system to solve the problem of single function and incomplete test data of the existing chip testing equipment

Method used

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Embodiment Construction

[0035] The technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Apparently, the described embodiments are only some of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without making creative efforts belong to the scope of protection of this application.

[0036] The embodiment of the present application provides a chip testing system to solve the problems of single function and incomplete test data of existing chip testing equipment. It will be described below in conjunction with the accompanying drawings.

[0037] see figure 1 and figure 2 as shown, figure 1 It is a top view of the chip testing system provided by the embodiment of the present application. figure 2 It is an axonometric view of the chip testing system provid...

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Abstract

The invention provides a chip testing system which comprises a first platform, a feeding mechanism, a simulation laser mechanism, a first testing mechanism, a second testing mechanism, a third testing mechanism and a controller, and the feeding mechanism, the simulation laser mechanism, the first testing mechanism, the second testing mechanism and the third testing mechanism are connected with the controller. The integrating sphere of the first testing mechanism is used for obtaining a first testing signal, the second testing mechanism is matched with the integrating sphere, a fifth light intensity signal is obtained through the integrating sphere, and the third testing mechanism is used for obtaining third light intensity information and a fourth light intensity signal; the controller is used for calculating to obtain bare test power, test power and a divergence angle according to the first light intensity signal, the fifth light intensity signal, the third light intensity signal and the fourth light intensity signal, calculating the polarization degree of the chip to be tested according to the bare test power and the test power, and judging whether the chip to be tested is qualified or not according to the bare test power, the polarization degree and the divergence angle; and outputting a test result. And the test efficiency and accuracy are improved.

Description

technical field [0001] The application belongs to the technical field of semiconductor testing, and in particular relates to a chip testing system. Background technique [0002] With the rapid development of the semiconductor laser industry, the laser chip is tested. However, in the existing test equipment, the function of the test equipment is single, and it is necessary to test different performances on different test equipment. During the test, it needs to be replaced frequently. The test equipment has low test efficiency, and the data tested by all test equipment is stored separately, so the integrity of the data cannot be tested. Contents of the invention [0003] The embodiment of the present application provides a chip testing system to solve the problems of single function and incomplete test data of existing chip testing equipment. [0004] In the first aspect, the embodiment of the present application provides a chip testing system, including: [0005] the firs...

Claims

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Application Information

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IPC IPC(8): G01R31/28
Inventor 彭琪黄思琪叶杨椿魏秀强苏文毅余漫闫大鹏
Owner WUHAN RAYCUS FIBER LASER TECHNOLOGY CO LTD
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