Method for judging reliability of nand flash memory data, storage medium and storage device

A reliability and data technology, applied in the direction of input/output to record carrier, etc., can solve problems such as killing blocks by mistake, data loss, and reducing the space used by SSD, so as to achieve the effect of ensuring reliability and extending service life
CN114281271BActive Publication Date: 2022-05-13DERA CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
DERA CO LTD
Publication Date
2022-05-13

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Abstract

The present invention relates to the technical field of data storage, and provides a method for judging the reliability of NAND flash memory data, a storage medium, and a storage device. The data reliability of each physical block is divided into levels; the optimal processing method of each physical block is determined according to the data reliability level corresponding to each physical block; each physical block is processed according to the optimal processing method matching its data reliability level. The present invention classifies the data reliability of each physical block in the NAND flash memory according to the error type of the physical page page on the physical block block in the NAND flash memory, and uses different optimization processing methods for different levels of data reliability to avoid data retention Misjudgment caused by other factors can prolong the service life of SSD. At the same time, real and unreliable blocks can be detected in advance to ensure data reliability.
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Description

technical field

[0001] The invention relates to the technical field of data storage, in particular to a method for judging the reliability of NAND flash memory data, a storage medium and a storage device. Background technique

[0002] One of the characteristics of NAND flash memory is that as the use and data storage time become longer, the data stored in the flash memory is more prone to bit flips and random errors. The sources of these errors include data retention (data retention), increase in the number of erasing and writing (Program / Erase Count), read disturbance, coupling between storage cells, etc., and these factors will affect the reliability of data in NAND. Therefore, in the process of using the SSD, some data integrity technologies need to be adopted to ensure the reliability of the data. Common technologies include: ECC error correction, RAID data recovery, reread (read retry), scan rewrite technology (read scrub), data randomization, etc. The re-read technol...

Claims

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