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Method for judging reliability of nand flash memory data, storage medium and storage device

A reliability and data technology, applied in the direction of input/output to record carrier, etc., can solve problems such as killing blocks by mistake, data loss, and reducing the space used by SSD, so as to achieve the effect of ensuring reliability and extending service life

Active Publication Date: 2022-05-13
DERA CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the existing technical solutions cannot achieve this. The existing technology is not only prone to accidental killing of blocks, which reduces the space used by SSDs, but also cannot remove unreliable blocks as soon as possible, and there is a risk of data loss.

Method used

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  • Method for judging reliability of nand flash memory data, storage medium and storage device
  • Method for judging reliability of nand flash memory data, storage medium and storage device

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Embodiment Construction

[0036] Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited by the embodiments set forth herein. Rather, these embodiments are provided for more thorough understanding of the present disclosure and to fully convey the scope of the present disclosure to those skilled in the art.

[0037] Those skilled in the art will understand that unless otherwise stated, the singular forms "a", "an", "said" and "the" used herein may also include plural forms. It should be further understood that the word "comprising" used in the description of the present invention refers to the presence of said features, integers, steps, operations, elements and / or components, but does not exclude the presence or addition of one or more o...

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Abstract

The present invention relates to the technical field of data storage, and provides a method for judging the reliability of NAND flash memory data, a storage medium, and a storage device. The data reliability of each physical block is divided into levels; the optimal processing method of each physical block is determined according to the data reliability level corresponding to each physical block; each physical block is processed according to the optimal processing method matching its data reliability level. The present invention classifies the data reliability of each physical block in the NAND flash memory according to the error type of the physical page page on the physical block block in the NAND flash memory, and uses different optimization processing methods for different levels of data reliability to avoid data retention Misjudgment caused by other factors can prolong the service life of SSD. At the same time, real and unreliable blocks can be detected in advance to ensure data reliability.

Description

technical field [0001] The invention relates to the technical field of data storage, in particular to a method for judging the reliability of NAND flash memory data, a storage medium and a storage device. Background technique [0002] One of the characteristics of NAND flash memory is that as the use and data storage time become longer, the data stored in the flash memory is more prone to bit flips and random errors. The sources of these errors include data retention (data retention), increase in the number of erasing and writing (Program / Erase Count), read disturbance, coupling between storage cells, etc., and these factors will affect the reliability of data in NAND. Therefore, in the process of using the SSD, some data integrity technologies need to be adopted to ensure the reliability of the data. Common technologies include: ECC error correction, RAID data recovery, reread (read retry), scan rewrite technology (read scrub), data randomization, etc. The re-read technol...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F3/06
Inventor 宛丽娟薛红军蒲强孟欣
Owner DERA CO LTD
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