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ODT calibration method, computer equipment and storage medium

A calibration method, storage medium technology, applied in static memory, instruments, etc.

Active Publication Date: 2022-04-29
深圳市晶存科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, there is no corresponding ODT calibration method to adjust the ODT value required by the memory

Method used

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  • ODT calibration method, computer equipment and storage medium
  • ODT calibration method, computer equipment and storage medium
  • ODT calibration method, computer equipment and storage medium

Examples

Experimental program
Comparison scheme
Effect test

example 1

[0075] Example 1, refer to Figure 4 , the method in Example 1 specifically includes:

[0076] Obtain the initial resistance value R and the total number of calibration times N;

[0077] Get the current calibration times A=1;

[0078] Determine the target resistance value r of the ODT according to the ratio of the initial resistance value to the current calibration times, r=R / A;

[0079] Carry out the Training action according to the target resistance value r, and record the operating index corresponding to the target resistance value r, where the operating index is the parameter value related to the Training action, A+1;

[0080] When the current number of calibration times A is greater than the total number of calibration times N, the final resistance value is selected from multiple target resistance values ​​according to the operating index as the calibrated resistance value of the ODT. For example, if the operation index is the eye width value, select the target resista...

example 2

[0081] Example 2, refer to Figure 5 , the method in Example 2 specifically includes:

[0082] Obtain the initial resistance value R and the total number of calibration times N;

[0083] Get the current calibration times A=1;

[0084] Determine the gear value B according to the current calibration times A, and determine the target resistance value r of the ODT according to the ratio of the initial resistance value to the gear value, r=R / B;

[0085] Carry out the Training action according to the target resistance value r, and record the operating index corresponding to the target resistance value r, where the operating index is the parameter value related to the Training action, A+1;

[0086] When the current number of calibration times A is greater than the total number of calibration times N, the final resistance value is selected from multiple target resistance values ​​according to the operating index as the calibrated resistance value of the ODT. For example, if the ope...

example 3

[0087] Example 3, refer to Image 6 , the method in Example 3 specifically includes:

[0088] When the memory is in a low-frequency state, ODT is generally turned off by default, and normal Training operations are performed;

[0089] The ODT function is only enabled when the memory is in a high-frequency state, and the initial resistance value R and the total number of calibration times N are obtained;

[0090] Get the current calibration times A=1;

[0091] Determine the target resistance value r of the ODT according to the ratio of the initial resistance value to the current calibration times, r=R / A;

[0092] Carry out the Training action according to the target resistance value r, and record the operating index corresponding to the target resistance value r, wherein the operating index is the parameter value A+1 related to the Training action;

[0093] Proceed to the next Training action according to A. When the current calibration times A is greater than the total calib...

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Abstract

The invention discloses an ODT calibration method, computer equipment and a storage medium. The method comprises the following steps: acquiring an initial resistance value and a total calibration frequency; obtaining a current calibration frequency; determining a target resistance value of the ODT according to the initial resistance value and the current calibration times; performing a Training action according to the target resistance value, and recording an operation index corresponding to the target resistance value; and when the current calibration frequency is greater than the total calibration frequency, selecting a final resistance value from the plurality of target resistance values according to the operation index as a calibrated resistance value of the ODT. According to the method provided by the invention, the ODT is automatically calibrated by dynamically adjusting the ODT value, and the ODT value required by the memory can be automatically adjusted. Compared with a fixed ODT value, the ODT automatic calibration can effectively solve the problem of poor chip consistency, the problem of adaptation and compatibility of different memory chips on the same SoC system and the problem of adaptation and compatibility of the same memory chip on different SoC systems, can also improve the problem of machine crash caused by incorrect ODT value setting, and reduces the debugging time of developers.

Description

technical field [0001] The invention relates to the technical field of memory testing, in particular to an ODT calibration method, computer equipment and storage media. Background technique [0002] In related technologies, a large amount of termination resistors are added to the motherboard of the early DDR SDRAM to prevent signal reflection at the end of the data line. This not only increases the manufacturing cost, but also the effect is not very good. Starting from DRR2, the terminal resistance has been added to the inside of the DDR particle, which is also called ODT (On-Die Termination, the terminal resistance on Die). However, the same DRAM chip may need to be matched with different ODT values ​​on different SoCs. Different types and capacities of DRAM chips may be adapted to the same SoC, and the required ODT values ​​are also different. At present, there is no corresponding ODT calibration method to adjust the ODT value required by the memory. Contents of the inv...

Claims

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Application Information

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IPC IPC(8): G11C29/56
CPCG11C29/56
Inventor 刘孜
Owner 深圳市晶存科技有限公司