A method of scanning and splicing with precise calculation of pore rate
An application method and technology of porosity, applied in the field of optics, can solve the problems of unguaranteed accuracy, slow image output rate, unsuitable accuracy, etc., to achieve improved efficiency and porosity calculation efficiency, reduce overlap rate, The effect of improving adaptability
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Embodiment 1
[0024] The application method of scanning and splicing for accurately measuring the porosity of the present invention is used in the image processing of measuring the porosity of the material tissue, and it includes the following steps:
[0025] a. Automatically focus under the condition of low magnification observation, and use the acquisition camera to take a complete image of the sample, and use anisotropic diffusion filtering to retain the edge of the image for the overall image area S 试样 Calculate, according to the shape and grayscale parameters in the empirical database, highlight the impurity noise area, and set the defect parameters according to the empirical data of the pore size of the corresponding material structure, highlight the defect position of the abnormal pores, according to the formula S 子 =S 试样 / k (1≤k≤3) Set the preset target field of view frame, avoid or include the least impurity noise area and defect position, select the best measurement area, and auto...
Embodiment 2
[0031] The application method of scanning and splicing for accurately measuring the porosity of the present invention is used in the image processing of measuring the porosity of the material tissue, and it includes the following steps:
[0032] a. Automatically focus under the condition of low magnification observation, and use the acquisition camera to take a complete image of the sample, and use anisotropic diffusion filtering to retain the edge of the image for the overall image area S 试样 Calculate, according to the shape and grayscale parameters in the empirical database, highlight the impurity noise area, and set the defect parameters according to the empirical data of the pore size of the corresponding material structure, highlight the defect position of the abnormal pores, according to the formula S 子 =S 试样 / k (1≤k≤3) Set the preset target field of view frame, avoid or include the least impurity noise area and defect position, select the best measurement area, and autom...
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