Full-automatic chip testing machine

Abstract

The invention discloses a full-automatic chip testing machine which comprises a first machine table, a second machine table and a third machine table, the second machine table and the third machine table are arranged in parallel, the second machine table and the third machine table are vertically connected to the first machine table, mounting supports are arranged on the second machine table and the third machine table, a plurality of testing mechanism mounting layers are arranged on the mounting supports, and the testing mechanism mounting layers are arranged on the testing mechanism mounting layers. A plurality of testing mechanisms are arranged on each testing mechanism mounting layer at intervals, and transfer feeding and transplanting manipulators are arranged on the corresponding sides of the second machine table and the third machine table. According to the invention, a full-automatic test mode of batch chips is adopted, a plurality of chips can be tested at the same time, and the test efficiency is improved. The test mechanism can realize the function test of the chip in a high and low temperature environment, and the test accuracy is improved. According to the automatic sorting device, qualified products and NG products can be sorted and respectively loaded on the NG product tray and the OK product tray to be collected, then the trays filled with chips can be carried out, and empty trays are supplemented to corresponding conveying lines.

Description

technical field [0001] The invention relates to chip testing equipment, in particular to an automatic chip testing machine. Background technique [0002] With the transformation of the production process, more and more automated equipment has been put into production line operations to replace manual simple and repetitive assembly line operations, thereby reducing labor costs, improving productivity and corporate competitiveness. [0003] At present, the chip automatic test line has been widely used, but in other links, such as chip loading, unloading, transfer, etc., further processing needs to be done manually, which increases the workload, reduces production efficiency, affects production capacity, and at the same time Also increases the production cost. SUMMARY OF THE INVENTION [0004] In order to overcome the shortcomings and deficiencies in the prior art, the purpose of the present invention is to provide a fully automatic chip testing machine. [0005] The purpos...

AI Technical Summary

Problems solved by technology

[0003] At present, the chip automatic test assembly line has been widely used, but in other links, such as chip loading, unloading, and material transfer, manual further processing is required, which increases the workload, reduces production efficiency, and affects production capacity. also increased production costs

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