Optical axis consistency calibration method and calibration system
A consistent, optical axis technology, used in testing optical performance, optics, optical components, etc., to save time and cost, good versatility, and intuitive results
Active Publication Date: 2022-07-29
CSIC ZHONGNAN EQUIP
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Problems solved by technology
[0010]
The invention provides an optical axis consistency calibration method and a calibration system, which solves the problem of parallel installation of photoelectric equipment to be installed relative to a known reference
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[0055] like Figure 1-2 , the existing target optoelectronic device 8 generally already exists on the mounting base 7, and the direction of the optical axis 801 of the target optoelectronic device has been determined. Generally, it is a known straight edge of the mounting base 7 or other objects. The device 6 to be installed needs to be added on the mounting base 7 , and the optical axis 601 of the device to be installed needs to be parallel to the optical axis 801 of the target optoelectronic device. In this context, the optical axis calibration method of the equipment 6 to be installed is as follows:
[0056] a. if figure 2 , to obtain the target optical axis reference, which is divided into three cases: the first one, when the target photoelectric device 8 exists but its focal length is small, the first calibration target object 4 and the second calibration target object 5 are respectively placed in front of the target photoelectric device 8, The line connecting the tips o...
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The invention provides an optical axis consistency calibration method and calibration system. A first calibration target object and a second calibration target object are respectively arranged at two ends of a simulation target axis; aiming at the end parts of the first proofreading target object and the second proofreading target object by using a first theodolite, so that the end parts of the first proofreading target object and the second proofreading target object are simultaneously imaged at the center of a cross division line of the first theodolite; placing a second theodolite on one side, close to the to-be-mounted equipment, of the first theodolite, horizontally rotating the first theodolite by 90 degrees, and adjusting the position of the second theodolite, so that the cross division line of the second theodolite coincides with the cross division line of the first theodolite during observation through the eyepiece; the position of the to-be-mounted equipment is adjusted by taking the second theodolite as a reference, so that the optical axis of the to-be-mounted equipment is parallel to the simulated target axis or the optical axis of the target photoelectric equipment, and the parallel mounting problem of the optical axis of the to-be-mounted photoelectric equipment relative to the known reference is solved.
Description
technical field [0001] The invention relates to the field of photoelectric equipment calibration, in particular to an optical axis consistency calibration method and calibration system. Background technique [0002] With the development of optoelectronic technology, optoelectronic equipment has been widely used in various fields. Optical axis consistency is an important performance index parameter. When installing and debugging optoelectronic equipment, an important basic work is optical axis calibration. Special calibration instruments are usually used for calibration. These instruments have high precision, but are expensive, bulky, and inconvenient for mobile installation and field use. When the installation site does not have the conditions, a limited and long-distance cooperation target is often used as the calibration benchmark. , compared with the infinite distance target calibration result provided by the special calibration instrument, the error is large, and the coo...
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Login to View More IPC IPC(8): G02B27/62G02B7/00G01M11/02
CPCG02B27/62G02B7/003G01M11/0242
Inventor 李伟朱守义任英陈慧拳谭颖李志坤
Owner CSIC ZHONGNAN EQUIP