Automatic testing device and method for embedded communication system

Abstract

The invention discloses an automatic testing device for an embedded communication system, which comprises an upper computer and a lower computer, the lower computer is connected with the upper computer through the Ethernet, and the lower computer is directly connected with the tested embedded communication system through a data bus; the invention further discloses an automatic testing method for the embedded communication system. By capturing the interface data of the tested embedded system, automatically constructing the data interaction process, generating the test case sequence, automatically executing and recording the test result and finally generating the test report, the problems existing in manual construction of the data interaction process in the field of embedded system testing are solved, automatic testing of the embedded system is achieved, and the test efficiency is improved. And the stability and reliability of the test process are enhanced, so that the test efficiency and coverage rate are improved.

Description

technical field [0001] The invention relates to the technical field of automatic testing, and in particular to an automatic testing device and method for an embedded communication system. Background technique [0002] At present, most integrated electronic systems such as aviation, aerospace, automobile, and communication are composed of embedded systems, and most of their function control and data cross-linking use the bus communication mode. [0003] Most of the embedded system testing in the above fields uses semi-physical simulation systems to construct bus data, simulate the communication between the peripheral equipment of the system under test and the system under test, inject control data into the embedded system under test, and monitor and observe the output data of the system under test at the same time. . However, the above-mentioned semi-physical simulation test systems often lack the ability to simulate the bus data interaction process, and do not have the abil...

AI Technical Summary

Problems solved by technology

However, the above hardware-in-the-loop simulation test systems often lack the ability to simulate the bus data interaction process, and do not have the ability to analyze the test results. In practical applications, the data interaction process development, abnormal test data construction, and testing are usually completed manually. According to the result analysis, there are the following significant problems in this method:

[0004] 1. The current system is becoming more and more complex, and it is difficult to cover all usage scenarios through manual construction of the data interaction process, resulting in low-probability defects that are easily missed;

[0005] 2. The test content has a certain degree of mechanicalness and repeatability in each round of testing, and the workload of manual testing is often large;

[0006] 3. If a large amount of test data needs to be completed in a short period of time, manual testing is almost impossible;

[0007] 4. It is difficult to effectively capture the redundant data that appears outside the established data requirements of the system under test

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