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Method of screening laminated ceramic capacitor

A technology of ceramic capacitors and screening methods, applied in the direction of multilayer capacitors, capacitors, capacitor manufacturing, etc., can solve problems such as deterioration of insulation resistance

Inactive Publication Date: 2001-05-02
MURATA MFG CO LTD
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  • Summary
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Problems solved by technology

[0003] However, in order to ensure that the multilayer ceramic capacitor has high insulation resistance characteristics, a voltage exceeding the rated voltage is applied to the multilayer ceramic capacitor judged as a good product by the conventional screening method in a high-temperature and high-humidity environment. However, when such an accelerated test is performed, there is a problem that the insulation resistance deteriorates.

Method used

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  • Method of screening laminated ceramic capacitor
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  • Method of screening laminated ceramic capacitor

Examples

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Embodiment 1

[0024] First, prepare a laminated ceramic capacitor with a length of 1.6 mm, a width of 0.8 mm, a thickness of 0.8 mm, an electrostatic capacitance of 0.22 μF, and a rated voltage of 16 V according to the known manufacturing method of the laminated ceramic capacitor 1. A capacitor manufactured by using Ni as the inner electrode 7, Cu as the outer electrode 6, and using a ceramic material with B characteristics on the active layer 8.

[0025] Next, a description will be given of a process in which a direct current 4 is applied superimposedly to the manufactured multilayer ceramic capacitor, and when a voltage is generated between the external electrodes 6, the multilayer ceramic capacitor achieves dielectric breakdown. In addition, the DC constant current 4 that has been energized by superimposition does not leak due to the humidity attached to the surface of the multilayer ceramic capacitor 1, and a voltage is generated between the external electrodes 6. In order to apply this ...

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Abstract

A method is provided for accurately screening monolithic ceramic capacitors to reject those having internal defects. A constant direct current is supplied between the external electrodes (6) of a monolithic ceramic capacitor (1) having defects (12) in its effective dielectric layer (8). When the voltage between the external electrodes (6) is increased and a voltage curve (11) becomes flat, the constant direct current (4) is further supplied for a predetermined time. If the voltage between the external electrodes (6) abruptly falls during the predetermined time, the capacitor is rejected as defective.

Description

technical field [0001] The invention relates to a screening method for laminated ceramic capacitors which ensures the insulation resistance characteristics of laminated ceramic capacitors. Background technique [0002] In the past, as a screening method for multilayer ceramic capacitors to ensure the insulation characteristics of multilayer ceramic capacitors, a direct voltage exceeding the rated voltage was repeatedly applied between the external electrodes of multilayer ceramic capacitors, and the defective part of the dielectric ceramic layer was electrically destroyed and removed. The withstand voltage test method of capacitors whose insulation resistance value has deteriorated; the insulation resistance measurement test method of measuring the insulation resistance after a certain period of time after applying a DC voltage, and removing capacitors that cannot return to the reference value; measuring the leakage current value after a certain period of time after applying ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G01R31/01H01G4/30H01G13/00
CPCG01R31/016
Inventor 山下由起人大参智饭野猛稻垣茂树菊池立郎富田义纪
Owner MURATA MFG CO LTD
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