Optical projection measurer for external diameter of large wheel diameter

An optical projection and measurement device technology, applied in the field of measurement, can solve problems such as large positioning error, long measurement optical path, and decreased measurement accuracy, and achieve the effects of less positioning error, good stability, and compact structure
CN1330927CInactive Publication Date: 2007-08-08WUHAN UNIV OF TECH
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Patent Information

Authority / Receiving Office
CN Ā· China
Patent Type
Patents(China)
Current Assignee / Owner
WUHAN UNIV OF TECH
Publication Date
2007-08-08
Estimated Expiration
Not applicable Ā· inactive patent

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Abstract

The present invention discloses a large wheel diameter outside diameter optical projection measuring equipment. It includes a mechanical positioning component and an optical measuring head mounted on the mechanical positioning component. Said optical measuring head is composed of back projection laser source, beam expander lens, optical slit component, imaging lens component, CCD camera and signal control processing device. It is applicable to diameter measurement of geometric revaling body whose wheel diameter is greater than 500mm, specially it is applicable to diameter measurement of geometric revolving body whose thread width is greater than 80 mm.
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Description

technical field

[0001] The invention belongs to the technical field of measurement, and relates to a measuring device for calculating the diameter of a circle based on the chord height method, in particular to an optical projection measuring device for the outer diameter of a large wheel. Background technique

[0002] As a powerful tool for measuring diameter by projection imaging, optical diameter measuring device has been widely used in geometric shape measurement research. In recent years, a lot of research on this technology by scientific and technical personnel has always been based on the method of directly measuring the diameter. In the article "Double Beam Laser Scanning Dimension Measurement System" {see "Semiconductor Optoelectronics" 1998, 19(5): 320~323}, a typical diameter projection imaging measurement method and device are proposed, which is characterized in that the measured The geometrical body of revolution is installed on the frame of the measuring equipm...

Claims

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