Method and device for testing printed circuit boards with a parallel tester
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- ATG TEST SYST
- Publication Date
- 2003-10-15
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
field of invention
[0001] The present invention relates to a method and apparatus for testing printed circuit boards, and more particularly to a method and apparatus for testing unpopulated circuit boards. Background technique
[0002] Printed circuit boards have multiple meshes whose density increases with the continued miniaturization of electronic components. This correspondingly increases the density of circuit board contact points described below as circuit board test points.
[0003] Known devices for electrical testing of printed circuit boards can be basically divided into two categories. The first category is represented by parallel testers, which have an adapter for simultaneously contacting all circuit board test points to be scanned. The second category includes sequential testers. This specifically includes finger testers, devices that utilize two or more contact heads to sequentially scan individual circuit board test points.
[0004] Parallel testers and a...