Unlock instant, AI-driven research and patent intelligence for your innovation.

Internal memory test system and method

A memory test and memory technology, applied in static memory, detection of faulty computer hardware, instruments, etc., can solve problems such as tediousness, reduce test efficiency, etc., and achieve the effect of improving test speed

Inactive Publication Date: 2006-01-18
HONG FU JIN PRECISION IND (SHENZHEN) CO LTD +1
View PDF0 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, for the product shipment test, the main disadvantage is that when the memory is mass-produced, the yield rate is a predictable variable, that is to say, the quality of most memory is relatively guaranteed.
At this time, most memory test items are very basic and simple, and the implementation of test tasks is not complicated. If the above method is used, it will be too cumbersome and reduce the test efficiency.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Internal memory test system and method
  • Internal memory test system and method
  • Internal memory test system and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0013] see figure 1 , is a schematic diagram of the architecture of the memory 40 testing system of the present invention. The system includes: a user interface 10 for inputting test commands and parameters, in this embodiment, the user interface 10 is a command line interface; a driver 20 and a test execution device 30 . Wherein, the driver program 20 includes a command line editor 201. Before using the user interface 10, the user needs to first activate the command line editor 201 to control the maximum allowable length of the command entered by him. In this specific embodiment, the maximum The allowable length is 255 characters; a command translator 202, which calls relevant subroutines according to the test command and parameters input by the user; an error flag 203, which identifies when an error occurs in the tested memory 40; and an error count 204 , to count the number of 40 error occurrences of the tested memory. The test execution device 30 is used for performing a...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to an internal memory measuring system, which comprises: a user interface used to input measuring order and parameter, a driven program which comprises an order line editor and an order translator used to call the relative subprogram according to the inputted measuring order and parameter, and a measure executing device used to do reading-writing measuring to internal memory and return the measuring result into user interface by driven program.

Description

【Technical field】 [0001] The invention relates to a product testing system and method, in particular to a memory testing system and method. 【Background technique】 [0002] Memory (including SDRAM, DDR, Flash memory and other volatile or non-volatile memory) needs to be tested after manufacturing to meet the quality requirements for shipment. [0003] The common memory test method is generally to use special equipment to test the memory, and judge whether the memory is working normally by detecting whether the data in the read and write process is correct or not. Including: random address test for memory; storage column test for memory; random block test for memory; self-refresh test for memory, etc. [0004] The items of the above-mentioned memory test method are relatively comprehensive and suitable for laboratory testing of memory. However, for the product shipment test, the main disadvantage is that when the memory is mass-produced, the yield rate is a predictable varia...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22G06F13/10G11C29/00
Inventor 曾鑫何唐
Owner HONG FU JIN PRECISION IND (SHENZHEN) CO LTD