Check patentability & draft patents in minutes with Patsnap Eureka AI!

Semiconductor memory

一种存储器、半导体的技术,应用在静态存储器、数字存储器信息、信息存储等方向,能够解决振荡器电路设计振荡器测试复杂等问题,达到功耗增大量小、防止数据丢失的效果

Inactive Publication Date: 2006-12-20
SOCIONEXT INC
View PDF0 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This therefore complicates both the circuit design of the oscillator and the testing of the oscillator

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Semiconductor memory
  • Semiconductor memory
  • Semiconductor memory

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0030]Hereinafter, embodiments of the present invention will be described with reference to the drawings. In the drawing, the signal line indicated by the thick line includes a plurality of bits. The double circles in the drawings indicate external terminals. A part of the block to which the thick line is connected includes a plurality of circuits. To indicate the signal line to which the signal is sent, a symbol equal to the signal name is used. The signal with " / " at the head indicates negative logic. The signal with "Z" at the end indicates positive logic.

[0031] figure 1 An embodiment of the semiconductor memory of the present invention is shown. The semiconductor memory is formed using CMOS technology and includes FCRAM (Fast Cycle RAM) with a DRAM memory cell (dynamic memory cell) and an SRAM interface. An FCRAM with an SRAM interface is a pseudo-SRAM that periodically performs a refresh operation in the chip without receiving a refresh command from the outside, and save...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

An oscillator generates a refresh request signal periodically. A storing circuit changes a stored value by a predetermined value in response to the refresh request signal and returns the stored value by one in response to a refresh operation. A store control circuit, when a state detecting circuit detects a change of an operational state of a semiconductor memory, increases or decreases the predetermined value which the storing circuit uses. A refresh decision circuit outputs refresh signals of a number corresponding to the stored value until the stored value returns to an initial value. This makes it possible to change the frequency of the refresh operations according to a change of the operational state without changing an oscillation cycle of the oscillator. Without unnecessary oscillation of the oscillator, it is possible to decrease a standby current of the semiconductor memory.

Description

Technical field [0001] The present invention relates to a semiconductor memory that requires periodic refresh operations to maintain data written in dynamic memory cells. More specifically, the present invention relates to a semiconductor memory that automatically performs a refresh operation internally without a refresh command from the outside. Background technique [0002] In pseudo SRAMs with dynamic memory cells and DRAMs with self-refresh modes, it is necessary to periodically refresh the memory cells using internal circuits to maintain data written in the memory cells. Specifically, this type of semiconductor memory incorporates a refresh timer that generates a refresh request signal for performing a refresh operation. Generally speaking, the refresh timer includes an oscillator that generates an oscillation signal, and a frequency divider that periodically generates a refresh request signal by dividing the frequency of the oscillation signal. [0003] The frequency of the...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G11C11/401G11C11/406
CPCG11C2211/4061G11C2211/4067G11C11/406G11C11/40603G11C11/40626G11C11/408
Inventor 奥山好明
Owner SOCIONEXT INC
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More