Method for measuring three-dimensional deformation of objects utilizing space carrier frequency electronic speckle interference

A technology of electronic speckle interference and three-dimensional deformation, which is applied in measurement devices, optical devices, instruments, etc., to achieve the effect of high sensitivity and high measurement accuracy

Inactive Publication Date: 2007-03-21
SHANDONG NORMAL UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Three-dimensional measurement of electronic speckle interference fringes by space carrier frequency method has not been reported yet

Method used

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  • Method for measuring three-dimensional deformation of objects utilizing space carrier frequency electronic speckle interference
  • Method for measuring three-dimensional deformation of objects utilizing space carrier frequency electronic speckle interference
  • Method for measuring three-dimensional deformation of objects utilizing space carrier frequency electronic speckle interference

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Experimental program
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Embodiment Construction

[0025] The two-beam optical path of the three-dimensional space phase-shifting electronic speckle interference system in the xoz plane and yoz plane is shown in Figure 1, including mirrors 1 and 9, beam expanders 2 and 8, half mirrors 3, 4 and 6. Camera 5, lens 7 and rotating platform 10. Two identical light paths are set up in the horizontal and vertical directions to measure the horizontal component (u field) and vertical component (v field) of the in-plane displacement field respectively. The deflection of the mirror 1 is driven by a stepping motor. When mirror 1 is deflected, carrier fringes are introduced. But to the measurement of out-of-plane displacement field, then will use optical path as shown in Figure 2, and optical path shown in Figure 2 comprises reflecting mirror 11, 12, 14, 20 and 21, beam expander 13, camera 15, half mirror 16, 17 and 18 and lens 19. The object to be measured is placed on a rotating platform 10 driven by a stepping motor, and the stepping ...

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Abstract

The invention provides a method to measure the three-dimensional distortion of the object by the spatial carrier frequency electron speckle interference. It illumines the object by the three coherent lights of the horizontal, the vertical and the vertical to the surface of the object directions; it leads the carrier wave by controlling the deflection of the reflector in the horizontal and the vertical direction to adjust the interference fringe of the displacement field; it adjusts the interference fringe of the off-face displacement field by the deflection of the object. It gets the phase position of every distorted field by the Fourier transformation to reach the measurement of the three dimensions. The invention has the high delicacy and precision, soothe precision can be improved to 1/20 waves.

Description

technical field [0001] The invention relates to a method for measuring three-dimensional deformation of an object. Background technique [0002] In engineering, the deformation of the structure is three-dimensional. For example, in terms of diesel engine design, the structure of its parts is complex and the deformation is three-dimensional. Accurate measurement of its three-dimensional deformation can then know its three-dimensional stress and strain distribution. , stiffness and strength analysis have practical significance. At present, the three-dimensional displacement measurement methods using electronic speckle interferometry are all time-phase shift measurement methods, each with its own characteristics, conditions and environments for its application. These time phase shift measurement methods all require precise phase shift equipment and have high requirements on the measurement environment. [0003] Compared with the time phase shift method, the method of spatial ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/16
Inventor 孙平
Owner SHANDONG NORMAL UNIV
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