Method for measuring three-dimensional deformation of objects utilizing space carrier frequency electronic speckle interference
A technology of electronic speckle interference and three-dimensional deformation, which is applied in measurement devices, optical devices, instruments, etc., to achieve the effect of high sensitivity and high measurement accuracy
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[0025] The two-beam optical path of the three-dimensional space phase-shifting electronic speckle interference system in the xoz plane and yoz plane is shown in Figure 1, including mirrors 1 and 9, beam expanders 2 and 8, half mirrors 3, 4 and 6. Camera 5, lens 7 and rotating platform 10. Two identical light paths are set up in the horizontal and vertical directions to measure the horizontal component (u field) and vertical component (v field) of the in-plane displacement field respectively. The deflection of the mirror 1 is driven by a stepping motor. When mirror 1 is deflected, carrier fringes are introduced. But to the measurement of out-of-plane displacement field, then will use optical path as shown in Figure 2, and optical path shown in Figure 2 comprises reflecting mirror 11, 12, 14, 20 and 21, beam expander 13, camera 15, half mirror 16, 17 and 18 and lens 19. The object to be measured is placed on a rotating platform 10 driven by a stepping motor, and the stepping ...
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