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Method for detecting chromaticity of luminescence, intensity, and white balance of semiconductor light source

A technology of semiconductor and white balance, applied in optical radiation measurement, color measurement device, color measurement using electric radiation detector, etc., can solve the problem that color sensitive sensor cannot measure color tristimulus value at the same time, achieve low cost, measurement The effect of high precision and low dexterity

Inactive Publication Date: 2007-05-09
BEIJING NORMAL UNIVERSITY
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Problems solved by technology

[0004] It is generally believed that this kind of color-sensitive sensor cannot measure the tristimulus value of the color at the same time, but can measure the wavelength of monochromatic light, or distinguish the polychromatic light composed of two different spectra, that is, color difference discrimination (see B.R.Chen, et al., "The identification of color difference of polychromatic light by silicon color sensor with double PN junction", Sensors and Actuators A, Vol.109, p.72-75, 2003)

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  • Method for detecting chromaticity of luminescence, intensity, and white balance of semiconductor light source
  • Method for detecting chromaticity of luminescence, intensity, and white balance of semiconductor light source
  • Method for detecting chromaticity of luminescence, intensity, and white balance of semiconductor light source

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Embodiment Construction

[0033] When the present invention is implemented, the light emitted by the semiconductor light source enters the detector from the incident window of the buried double pn junction semiconductor light wavelength detector. During operation, the two p-n junction photodiodes of the detector from shallow to deep can be reverse-biased or unbiased; during operation, the two p-n junction photodiodes of the detector from shallow to deep can simultaneously detect optical signals , were photocurrent I1 and I2. The ratio of I2 to I1 has nothing to do with the incident light power, and has a monotone corresponding relationship with the central wavelength of the incident light of the semiconductor light source. The central wavelength of the monochromatic light can be obtained by measuring the ratio of I2 and I1 of the detector calibrated in advance.

[0034] The light intensity of the semiconductor light source can be obtained by measuring I1 and I2 of the semiconductor optical wavelength ...

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Abstract

A method for detecting luminous colority and intensity as well as white balance of semiconductor light source includes utilizing buried double Pn junction semiconductor wavelength detector not only to measure wavelength but also measure luminous intensity as well as furthermore to detect white balance of white light mixed by three basic semiconductor light sources of red, green and blue.

Description

1. Technical field [0001] The invention relates to a method of detecting the luminous chromaticity, intensity and white balance of a semiconductor light source (such as a semiconductor laser, a superluminescent light-emitting diode, an edge-emitting diode, a narrow spectral line width surface-emitting light-emitting diode, etc.) by using a buried double pn junction semiconductor optical wavelength detector Methods. It belongs to the fields of photoelectric detection, chromaticity measurement, semiconductor technology and the like. 2. Background technology [0002] Semiconductor light sources such as semiconductor light-emitting diodes have the advantages of power saving, long life, pure chromaticity, no flicker, and environmental protection. They are widely used in the fields of lighting, display, and lighting. They may replace incandescent lamps and fluorescent lamps and become the future general lighting. Preferred (see Jeff Y. Tsao, "SOLID-STATE LIGHTING: LAMPS, CHIPS AN...

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Application Information

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IPC IPC(8): G01J9/00G01J1/42G01J3/50
Inventor 韩德俊
Owner BEIJING NORMAL UNIVERSITY
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