Atomic-force microscope needle-tip washing method and apparatus
An atomic force microscope and cleaning device technology, applied in cleaning methods and utensils, cleaning methods using liquids, measuring devices, etc., can solve the problems of complicated and time-consuming operation procedures, and achieve low scanning costs, simple operation, and high decontamination efficiency. Effect
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[0020] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.
[0021] As shown in Fig. 1 and Fig. 2, the cleaning device of the present invention includes two parts, an annular base [1] and an annular cover [4]. The inner and outer diameters of the base [1] and the cover [4] are the same, and the base [1] ] has a plurality of grooves [2], the grooves [2] are slightly wider than the base of the probe, and the depth is equivalent to the thickness of the probe, and are used to hold the probe. The screws go through the through holes [5] and screw holes [3] to fix the cover [4] and the base [1].
[0022] Before cleaning, first dissolve 1ml of detergent into 50ml of deionized water to prepare a cleaning solution; apply a small amount of nail polish on the back of the lower part of the probe without the needle tip, and adhere to the ring-shaped base of the cleaning device [1] In the groove [2], point one end of ...
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