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Atomic-force microscope needle-tip washing method and apparatus

An atomic force microscope and cleaning device technology, applied in cleaning methods and utensils, cleaning methods using liquids, measuring devices, etc., can solve the problems of complicated and time-consuming operation procedures, and achieve low scanning costs, high decontamination efficiency and simple operation Effect

Inactive Publication Date: 2010-05-26
INST OF ELECTRICAL ENG CHINESE ACAD OF SCI
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  • Abstract
  • Description
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  • Application Information

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Problems solved by technology

The advantage of this method is that the pollutants are removed very cleanly, but the operation procedure is complicated and time-consuming

Method used

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  • Atomic-force microscope needle-tip washing method and apparatus
  • Atomic-force microscope needle-tip washing method and apparatus
  • Atomic-force microscope needle-tip washing method and apparatus

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Embodiment Construction

[0020] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.

[0021] Such as figure 1 , figure 2 As shown, the cleaning device of the present invention includes two parts, an annular base [1] and an annular cover [4]. The base [1] and the cover [4] have the same inner and outer diameters, and there are multiple Groove [2], the groove [2] is slightly wider than the base of the probe, the depth is equivalent to the thickness of the probe, and is used to hold the probe. The screws go through the through holes [5] and screw holes [3] to fix the cover [4] and the base [1].

[0022] Before cleaning, first dissolve 1ml of detergent into 50ml of deionized water to prepare a cleaning solution; apply a small amount of nail polish on the back of the lower part of the probe without the needle tip, and adhere to the ring-shaped base of the cleaning device [1] In the groove [2], point one end of the probe tip towar...

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Abstract

The present invention relates to a kind of atomic force microscope probe point cleaning method. It is characterized by that said method includes the following steps: coating back surface of pointlessone end of lower half-portion of said probe with a small quantity of nail lacquer, fixing it in a cleaning device, placing said cleaning device in which the probe is placed in a dishware in which a cleaning liquor is held, then placing said dishware in an ultrasonic washing channel and low-frequency ultrasonic cleaning for 10 min. Said cleaning device includes two portions of ring-shaped base seatand ring-shaped cover plate, on the base seat several recessed grooves are cut, said base seat and cover plate are fixed together by means of screws.

Description

technical field [0001] The invention relates to a method and a cleaning device for cleaning the needle point of an atomic force microscope. Background technique [0002] Due to its advantages of easy operation, simple sample preparation, high resolution, flexible and intuitive image analysis, the atomic force microscope has become a necessary precision instrument in the field of nanoscience and microfabrication. The atomic force microscope forms an image by adjusting the force between the sample surface and the tip. The scanned image is the result of the convolution of the sample surface topography and the tip topography. Therefore, is the image obtained by the atomic force microscope faithful to the surface shape of the sample? The appearance is closely related to the shape of the needle tip. It can be seen that the probe tip is a key component of the atomic force microscope, which determines the resolution of the microscope and also determines the quality of the scanned i...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): B08B3/12G12B21/08G01Q60/38
Inventor 田丰韩立初明璋
Owner INST OF ELECTRICAL ENG CHINESE ACAD OF SCI
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