Non-contact apparatus and method for measuring surface profile

a technology of surface profiles and non-contact devices, applied in the direction of image analysis, instruments, measurement devices, etc., can solve the problems of increasing data acquisition and analysis time, inability to accurately measure, and inability to contact the surface,
US20060082787A1Inactive Publication Date: 2006-04-20SOUTHWEST RES INST
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Patent Information

Authority / Receiving Office
US · United States
Current Assignee / Owner
SOUTHWEST RES INST
Publication Date
2006-04-20
Estimated Expiration
Not applicable · inactive patent

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Abstract

Embodiments of the invention provide a non-contact method for measuring the surface profile of an object that can include generating a point-type optical signal and projecting it on a rotatable precision optical grating, generating a rotating pattern of light and dark lines onto the object, recording a series of images of the rotating pattern moving across the object with an image receiving device and calculating the surface profile of the object. Other embodiments can include a method to calibrate the system and a non-contact apparatus that generally includes a point-type light source, a rotatably mounted optical grating being configured to project a moving grating image on the object, a processor in communication with the image capturing device and configured to receive image input from the image capturing device and generate a surface profile representation of the object therefrom.
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Description

CROSS REFERENCE TO RELATED APPLICATIONS

[0001] This application is a utility patent application that claims benefit of U.S. Provisional Patent Application Ser. No. 60 / 301,180, filed Jun. 27, 2001, which is hereby incorporated by reference in it's entirety.BACKGROUND OF THE INVENTION

[0002] 1. Field of the Invention

[0003] The present invention generally relates to the determination of surface profiles through optical-based methodologies and apparatus.

[0004] 2. Description of the Related Art

[0005] Accurate measurements of surface profiles are an important element in the inspection of manufactured parts, particularly when the inspection process is an automated process. Current inspection / surface profile measurement systems generally utilize coordinate measuring machines / devices, laser displacement gauges, and / or other similar methods. However, conventional methods are generally configured to measure only a single point at a time, and therefore, these systems are both time and resour...

Claims

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