Two-dimensional small angle x-ray scattering camera

Abstract

A two-dimensional x-ray scattering camera includes a source, an optic, a detector, and a pair of collimating blocks. The source emits x-ray beams that are reflected by the optic towards a sample. The detector detects scattering from the sample, the pair of collimating blocks is positioned between the optic and the detector to collimate the beam. A bottom surface of one block is substantially parallel a top surface of the other block, and the blocks are rotatable relative to the beam about a pivot. The system forms a two-dimensional beam that is symmetric about the primary beam axis at the detector position, regardless how the beam is collimated by the collimating blocks. The system therefore eliminates smearing and can be used for anisotropic small angle scattering at high resolution and low Qmin.

Description

BACKGROUND [0001] The present invention relates generally to an x-ray scattering camera, and more particularly relates to a two-dimensional x-ray scattering camera. [0002] In x-ray scattering, the performance of the camera is typically characterized by the flux, the resolution, defined as the beam diameter at the detector position divided by the sample-to-detector distance, and a parameter Qmin defined as Qmin=4⁢πλ⁢sin⁢ ⁢θmin, where λ is the wavelength and θmin is the minimum access angle (i.e., the smallest angle, relative to the primary beam, at which meaningful scattering can be collected). In general, increasing the resolution of the system decreases the flux and Qmin, whereas increasing the flux decreases the resolution and Qmin. [0003] To address these issues, a camera known as a Kratky camera using a collimation block and an x-ray source in a line projection was developed. The Kratky camera has achieved high resolution, good flux and Qmin, but it is a one-dimensional camera ...

AI Technical Summary

Benefits of technology

[0007] Some embodiments of the invention may have one or more of the following advantages. The camera can be used to investigate anisotropic material and can be configured into a high resolution reflectometer, or a high resolution reflective SAXS camera. Since the sample-to-detector distance is not necessarily as long as in the pinhole camera case, the camera has a large angular range and may make it possible to use the camera in wide angle scattering.

Problems solved by technology

The Kratky camera has achieved high resolution, good flux and Qmin, but it is a one-dimensional camera and therefore suffers from smearing.

Although many de-smearing procedures have been developed, some amount of information is still unavoidably lost.

However, the pinhole camera has a low flux, low resolution, and its Qmin is limited to about 0.005 Å−1.

In sum, the fundamental limitations of each type of camera have not been overcome: the Kratky camera cannot be used for investigating anisotropic samples, and the pinhole camera cannot achieve a very high resolution and low Qmin.

Images