11 results about "Small-angle scattering" patented technology

Apparatus for examining a liquid or powdered sample (140) by means of ultrasmall angle X-ray scattering, comprising: a beam shaping device (120) comprising an elliptical mirror (120), a monochromator (130), an analyzer (150), and a detector (160) for X-ray radiation, wherein the monochromator (130) is arranged between the beam shaping device (120) and the analyzer (150) and wherein the beam shaping device (120) is configured to focus an X-ray beam (115) in front of the monochromator (130); wherein the liquid or powdered sample (140) is arranged between the monochromator (130) and the analyzer (150), wherein a focus of the elliptical mirror (120) is directed towards the monochromator (130).

The application discloses an in-situ temperature and humidity control grazing entry type small-angle scattering sample table and a testing method, relates to the technical field of in-situ small-angle scattering experimental equipment, and comprises a main support assembly, a temperature regulation assembly, a protection assembly and an interface assembly.The main support assembly is formed by a structural frame spliced to surround a bearing structure with an inner containing space.The temperature regulation assembly is used for providing a target temperature field.The protection assembly comprises a Capton film shell.The interface assembly is used for transmitting temperature control medium and humidity medium to the temperature control console.The testing docking assembly is used for realizing multi-pose docking with an external grazing incidence testing module.The main support assembly is equipped with a six-degree-of-freedom sample table, the window grazing entry angle is realized to be-3 to 5°, the wide temperature range high-speed regulation is realized to be-150℃ to 600℃ and 30℃ / min, the high-precision humidity control is realized to be 1%-95%RH and ±1%RH, the detachable Capton film is installed to realize effective isolation of the cavity inner and outer vacuum, and the 0.02mbar-1bar normal pressure or negative pressure and the rapid switching and multi-modal mechanical coupling of inert gas are supported.

The invention discloses a high-resolution and high-flux small-angle scatterometer which comprises a focus lens which is an ellipsoid multilayer film focus lens, the optical surface shape of the focus lens is determined by an ellipsoid, and a light source and a detector are arranged at the positions of a first focus and a second focus of the ellipsoid respectively. The focusing lens focuses the X-ray from the light source to the light sensing plane of the detector, and the focus of the straight-through light falls on the plane of the detector. According to the invention, the ellipsoid multilayer film focus lens is introduced to form a confocal light path, and the light source and the detector are respectively located at two focuses of the ellipsoid. Photons cut off by a traditional slit are actively collected, focused and utilized, and the luminous flux is greatly improved while the high resolution is kept; the light spot size d is matched with the pixel size of the detector, so that the light spot size d is controlled, and the light spot size d cooperates with the distance L to determine the angular resolution. In this way, the resolution performance of the device can be precisely customized, and the angular resolution and the incident luminous flux can be improved at the same time.

This invention discloses a method for reconstructing X-ray small-angle scattering (SAXS) patterns based on a physical information neural network, belonging to the field of nanostructure measurement. Through a differentiable physical information optimization framework driven by a physical information neural network, a given electron density template is used as input, and the output is a high-resolution, corrected electron density map. A loss function is calculated by comparing the SAXS pattern with an experimental X-ray small-angle scattering pattern, and the neural network structure is optimized based on the loss function to ensure physical realism and computational feasibility, thereby continuously optimizing the predicted electron density map and making it closer to the real sample. This invention eliminates the dependence on a pre-set geometric model, requiring only a single SAXS scattering pattern containing multi-angle information to faithfully reconstruct the true morphology of nanostructures containing arbitrarily complex and non-ideal features such as rounded corners, sidewall curvature, and chamfered edges. This fundamentally solves the model mismatch problem and significantly improves the accuracy, reliability, and applicability of X-ray small-angle scattering metrology.

The invention discloses a method for acquiring the phase size of fine particles in aluminum and nickel-based alloy, which comprises the following steps: acquiring two-dimensional synchrotron radiation diffraction data of aluminum and nickel-based alloy to be measured, and integrating the data to obtain a peak position-peak intensity curve; calibrating peak positions and full width at half maximum of each diffraction peak of a precipitated phase in the curve; substituting the calibration data into a calculation equation of the precipitated phase size for calculation so as to obtain the corresponding precipitated phase size; obtaining neutron small-angle scattering data of the to-be-detected alloy, selecting a corresponding small-angle scattering data model according to the shape of the fine particle phase, and fitting the neutron small-angle scattering data to obtain the size of the precipitated phase; and comparing and analyzing the two groups of precipitated phase sizes to obtain the final phase size of the fine particles in the aluminum and nickel-based alloy. The method provided by the invention meets the requirements of high accuracy, simple sample preparation and statistical significance of measurement results, and can provide reliable data support for research on the sizes of the precipitated phases of the aluminum and nickel-based alloy.

A method includes receiving, by a processing device, a first small angle scattering image of a substrate. The substrate includes a number of structures oriented at a first angle relative to a base of the substrate. The first small angle scattering image of the substrate is collected at a second angle of incidence of radiation relative to the base of the substrate, different than the first angle. The method further includes determining a first-order Fourier term associated with the first small angle scattering image by performing angular Fourier decomposition of the first small angle scattering image. The method further includes determining a value of the first angle based on the first-order Fourier term.

An information processing device includes: an acquiring section acquiring small angle scattering data obtained by measuring a material, and supplemental information that is two-dimensional data of the material; and a predicting section that, by using the small angle scattering data and the supplemental information as input, predicts a three-dimensional structure of the material from output of a prediction model that is learned in advance and that is for predicting the three-dimensional structure of the material.

The utility model discloses a full-automatic five-classification blood analyzer optical system which comprises a fixed seat fixedly connected with the upper side surface of a base, a flow chamber is arranged on the upper side surface of the fixed seat, an irradiation box body is arranged on one side of the flow chamber and fixedly connected with the base, and the irradiation box body is arranged on the other side of the flow chamber. And a front light assembly is arranged in the irradiation box body. According to the utility model, through the circular light barrier arranged in the center of the diaphragm I, direct laser light spots and small-angle scattered light signals can be shielded, the signal-to-noise ratio is improved, the sensitivity of a low-angle scattered light receiving assembly to left-right position deviation is reduced, the overall optical stability is improved, and the accuracy of a detection result is guaranteed.

The invention relates to a method for automatically calibrating small-angle scattering layout parameters, and belongs to the field of nuclear technology application. The method for automatically calibrating the small-angle scattering layout parameters comprises the following steps: acquiring an estimated center coordinate of a two-dimensional small-angle scattering spectrum of a standard sample by utilizing the central symmetry of two-dimensional scattering intensity distribution; calibrating the estimated center coordinate by optimizing the deviation value of the one-dimensional scattering intensity distribution in the symmetrical direction to obtain a calibrated center coordinate; acquiring a ring integral one-dimensional scattering curve according to the calibration center coordinate; acquiring an abscissa corresponding to a first scattering peak top point in the ring integral one-dimensional scattering curve; and calculating the distance from the standard sample to the detector according to the abscissa corresponding to the top point of the first scattering peak in the ring integral one-dimensional scattering curve and the scattering vector of the first scattering peak of the standard sample. The method can obtain the center coordinates of the two-dimensional scattering spectrum and the distance layout parameters from the sample to the detector, and has the advantages of rapidness, simplicity, high efficiency, high accuracy, high stability and easiness in operation.