Laser-based alignment support device (1) for assisting the alignment of an instrument (2) for
puncturing an object (3), in particular for an X-
ray imaging
system (4), comprising: - a first line
laser (5) for generating a first
laser beam in a first
laser plane (7), which is configured to generate a first
laser line (14) on a first surface line (9) of the instrument (2) in a first
section plane (11) of the instrument (2) when the first
section plane (11) coincides with the first
laser plane (7), and - a second line laser (6) for generating a second laser beam in a second
laser plane (8) intersecting the first
laser plane (7), characterized by: - a point-like shielding element (16) of the second line laser (6) for generating a shadow line (17) in the second laser plane (8), wherein the second line laser (6) is configuredto map a shadow point (18) of the shadow line (17) onto a second surface line (10) of the instrument (2) in a second
cutting plane (12) of the instrument (2) when the first
cutting plane (11) and the second
cutting plane (12) are aligned.