Unlock instant, AI-driven research and patent intelligence for your innovation.

Microparticle detection apparatus

a technology of microparticles and detection apparatuses, which is applied in the direction of fluorescence/phosphorescence, instruments, suspensions, etc., can solve the problems of reducing the detection reliability of microparticles, reducing the signal to noise ratio (snr) of scattering light detection, and inaccurate detection of scattering ligh

Inactive Publication Date: 2012-06-28
SAMSUNG ELECTRONICS CO LTD +1
View PDF2 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The present invention provides a microparticle detection apparatus that can detect scattered light from microparticles with high accuracy. The apparatus includes a light emitting optical element, a converging optical system, a particle path, a beam blocking unit, a condensing lens, and a detector. The focal point of the light emitted from the optical element and the converging optical system is located between the particle path and the beam blocking unit, which prevents stray light from being detected. The apparatus can detect the scattered light generated from particles introduced into the optical chamber and can be used in various fields such as biological research and environmental monitoring.

Problems solved by technology

However, light directly emitted from a light source without being scattered by a microparticle (hereinafter, referred to as direct light) may also be detected, and therefore, the detection of scattering light may be inaccurate.
That is, a signal to noise ratio (SNR) of scattering light detection may be low, thereby reducing detection reliability of a microparticle.
While the direct light may be reduced; however, the intensity of detected scattering light may also be reduced with the result that an SNR of scattering light detection may not be substantially improved.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Microparticle detection apparatus
  • Microparticle detection apparatus
  • Microparticle detection apparatus

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0061]Reference will now be made in detail to exemplary embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to like elements throughout.

[0062]FIG. 2 illustrates a microparticle detection apparatus 100 according to an embodiment of the present invention, and FIG. 3 is a sectional view of a microparticle detection apparatus 100;

[0063]Referring to FIGS. 2 and 3, the microparticle detection apparatus 100 includes a light source unit 110, an introduction unit 120, an optical chamber 130, a beam blocking unit 140 and a detection optical system 150.

[0064]The light source unit 110, which irradiates light to sample particles, includes a light emitting optical element 111 and a converging optical system 112 to converge light emitted from the optical element 111.

[0065]The optical element 111 may include a laser diode (LD) (not shown) or a light emitting diode (LED) (not shown).

[0066]The converging optical s...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
sizeaaaaaaaaaa
diameteraaaaaaaaaa
sizeaaaaaaaaaa
Login to View More

Abstract

A microparticle detection apparatus is provided. The microparticle detection apparatus includes a light emitting optical element, a converging optical system disposed in an advancing direction of light emitted from the optical element to converge the light, a particle path located in an advancing direction of the light having passed through the converging optical system so that the particle path intersects the light, a beam blocking unit to block direct light having passed through the particle path, a condensing lens disposed at the rear of the beam blocking unit, and a detector disposed at the rear of the condensing lens to detect light scattered by particles. A focal point of light formed by the optical element and the converging optical system may be located at the rear of the particle path. A focal point of light irradiated to the particles may be different from the introduction position of the particles.

Description

CROSS-REFERENCE TO RELATED APPLICATIONS[0001]This application is related to and claims priority to Korean Patent Application No. 10-2010-0136431, filed on Dec. 28, 2010 in the Korean Intellectual Property Office, the disclosure of which is incorporated herein by reference.BACKGROUND[0002]1. Field[0003]The embodiments discussed herein relate to a microparticle detection apparatus to optically detect microparticles floating in air.[0004]2. Description of the Related Art[0005]In recent years, interest in a safe atmosphere has increased. Therefore, microparticle detection technology for use by the general public to easily monitor atmospheric state in real time is being developed.[0006]An object to be detected, such as a microparticle, having a size of 0.1 to 1 μm may be detected using a method of detecting scattering of light induced by irradiating light to an aerosol-phase sample.[0007]Scattering caused by the microparticle is within a Mie scattering range. The intensity of scattering ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(United States)
IPC IPC(8): G01N21/47
CPCG01N15/06G01N21/21G01N2015/0693G01N21/64G01N2015/035G01N21/53G01N15/075
Inventor KWON, JOONHYUNGYOON, DU SEOPROH, HEE YUELKIM, SOO HYUNRYU, SUNG YOONKWON, WON SIKLEE, HYUB
Owner SAMSUNG ELECTRONICS CO LTD