Noise detection circuit, delay locked loop and duty cycle corrector including the same

Abstract

A noise detection circuit includes a first delay unit suitable for delaying a periodic wave to output a delayed periodic wave, a first divider unit suitable for dividing the delayed periodic wave to output a first periodic wave, a second divider unit suitable for dividing the periodic wave to output a divided periodic wave, a second delay unit suitable for delaying the divided periodic wave to output a second periodic wave, and a detection unit suitable for comparing the first periodic wave with the second periodic wave and outputting a noise detection signal.

Description

CROSS-REFERENCE TO RELATED APPLICATIONS[0001]The present application claims priority of Korean Patent Application No. 10-2013-0094348, filed on Aug. 8, 2013, which is incorporated herein by reference in its entirety.BACKGROUND[0002]1. Field[0003]Exemplary embodiments of the present invention relate to a technique for detecting noise occurring in an integrated circuit.[0004]2. Description of the Related Art[0005]Various integrated circuit chips operate based on a voltage applied from outside and internal voltages generated using the voltage applied from outside. However, when noise occurs in the voltages, the noise may cause various malfunctions of the integrated circuit chips.[0006]In particular, since a large number of integrated circuit chips operate in synchronization with a clock, noise occurring in the integrated circuit chips may cause malfunctions of circuits such as a delayed locked loop (DLL) and a duty cycle corrector (DCC) that control a variation in delay value of a cloc...

AI Technical Summary

Benefits of technology

The patent text discusses techniques for detecting noise in a circuit and controlling clock-based circuits based on the detected noise. The patent describes various embodiments of circuits and methods for effective noise detection and stable control of clock-based circuits. These techniques may be useful in improving the performance and reliability of electronic devices.

Problems solved by technology

However, when noise occurs in the voltages, the noise may cause various malfunctions of the integrated circuit chips.

In particular, since a large number of integrated circuit chips operate in synchronization with a clock, noise occurring in the integrated circuit chips may cause malfunctions of circuits such as a delayed locked loop (DLL) and a duty cycle corrector (DCC) that control a variation in delay value of a clock and the clock.

Thus, the noise may have a fatal influence on operations of the integrated circuit chips.

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