Noise detection circuit, delay locked loop and duty cycle corrector including the same

a technology of noise detection and integrated circuit, which is applied in the direction of pulse manipulation, transmission monitoring, pulse technique, etc., can solve the problems of circuit malfunction, noise may have fatal influence on the operation of the integrated circuit chip, and the integrated circuit chips may be malfunctioning, so as to achieve effective noise detection and control clock-based circuits.

Active Publication Date: 2015-02-12
SK HYNIX INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0007]Various exemplary embodiments are directed to a technique for effectively detecting noise and a technique for stably controlling clock-based circuits based on the detected noise.

Problems solved by technology

However, when noise occurs in the voltages, the noise may cause various malfunctions of the integrated circuit chips.
In particular, since a large number of integrated circuit chips operate in synchronization with a clock, noise occurring in the integrated circuit chips may cause malfunctions of circuits such as a delayed locked loop (DLL) and a duty cycle corrector (DCC) that control a variation in delay value of a clock and the clock.
Thus, the noise may have a fatal influence on operations of the integrated circuit chips.

Method used

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  • Noise detection circuit, delay locked loop and duty cycle corrector including the same
  • Noise detection circuit, delay locked loop and duty cycle corrector including the same
  • Noise detection circuit, delay locked loop and duty cycle corrector including the same

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Embodiment Construction

[0016]Various embodiments will be described below in more detail with reference to the accompanying drawings. The present invention may, however, be embodied in different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the present invention to those skilled in the art. Throughout the disclosure, reference numerals correspond directly to the like numbered parts in the various figures and embodiments of the present invention. It is also noted that, in this specification, “connected / coupled” refers to one component not only directly coupling another component but also indirectly coupling another component through an intermediate component. In addition, a singular form may include a plural form as long as it is not specifically mentioned in a sentence.

[0017]FIG. 1 is a block diagram illustrating a noise detection circuit in ac...

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Abstract

A noise detection circuit includes a first delay unit suitable for delaying a periodic wave to output a delayed periodic wave, a first divider unit suitable for dividing the delayed periodic wave to output a first periodic wave, a second divider unit suitable for dividing the periodic wave to output a divided periodic wave, a second delay unit suitable for delaying the divided periodic wave to output a second periodic wave, and a detection unit suitable for comparing the first periodic wave with the second periodic wave and outputting a noise detection signal.

Description

CROSS-REFERENCE TO RELATED APPLICATIONS[0001]The present application claims priority of Korean Patent Application No. 10-2013-0094348, filed on Aug. 8, 2013, which is incorporated herein by reference in its entirety.BACKGROUND[0002]1. Field[0003]Exemplary embodiments of the present invention relate to a technique for detecting noise occurring in an integrated circuit.[0004]2. Description of the Related Art[0005]Various integrated circuit chips operate based on a voltage applied from outside and internal voltages generated using the voltage applied from outside. However, when noise occurs in the voltages, the noise may cause various malfunctions of the integrated circuit chips.[0006]In particular, since a large number of integrated circuit chips operate in synchronization with a clock, noise occurring in the integrated circuit chips may cause malfunctions of circuits such as a delayed locked loop (DLL) and a duty cycle corrector (DCC) that control a variation in delay value of a cloc...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): H04B3/46
CPCH04B3/46H03L7/0814H03L7/0816H03L7/0812H03L7/081H03K5/1252
Inventor KANG, TAE-WOOKNA, KWANG-JIN
Owner SK HYNIX INC
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