70 results about "Duty cycle corrector" patented technology

A reduced-frequency, 50% duty cycle corrector (DCC) circuit may be used in an electronic device (e.g., a memory chip) to generate output clocks with 50% duty cycle irrespective of the duty cycle of the clock input to the DCC circuit. A DCC initialization scheme selectively activates the frequency division and edge detection operations in the DCC based on the lock status of the DCC during initialization. Upon initialization, the frequency division and edge detection operations are turned off or disabled. After the DCC is properly locked, these operations are enabled to obtain the 50% duty cycle output clock. This approach initializes the reduced-frequency DCC without output glitches, which can affect locking of a DLL with which the DCC may be used. The prevention of instability in locking of the DCC and DLL upon system initialization results in swift establishment of DCC and DLL locks without significant power consumption or loss of clock cycles. Once the DCC is locked during its initialization, the reduced-frequency operation of DCC further saves current consumption. Because of the rules governing abstracts, this abstract should not be used to construe the claims.

Digital duty cycle correction circuits are provided including a duty cycle detector circuit configured to generate first and second control values associated with a first internal clock signal and a second internal clock signal, respectively. A comparator circuit is also provided and is configured to compare the first control value to the second control value and provide a comparison result. A counter circuit is configured to perform an addition and / or a subtraction operation responsive to the comparison result to provide a digital code. A digital to analog converter is configured to generate third and fourth control values responsive to the digital code. Finally, a duty cycle corrector circuit is configured to receive first and second external clock signals and the first through fourth control values and generate the first and second internal clock signals having a corrected duty cycle. The first and second control values are received over a first path and the third and fourth control values are received over a second path, different from the first path. Related methods of operating duty cycle correction circuits are also provided.

A method for adjusting the relative phases of two signals includes receiving first and second signals, which may, for example, be derived from a differential clock signal. A duty cycle error between the first signal and the second signal is detected by comparing a phase component of the first signal with a phase component of the second signal. This duty cycle error can then be corrected by delaying the second signal by an amount based upon a result derived from the comparing.

The clock generator for semiconductor memory apparatus which includes: a first divider; a first delay unit; a second divider; a second delay unit; a duty-cycle corrector; a third divider; a third delay unit; a phase comparator; and a delay time setting unit. The clock generator for semiconductor memory apparatus exactly performs phase correction and duty cycle correction using frequency-divided clocks. Therefore, it is possible to generate reliable clocks and to improve the operational performance of a system using the clock generator.