Integrated circuit devices having improved duty cycle correction and methods of operating the same

A technique for correcting circuits, busyness and idleness, applied in electrical components, converting continuous pulse trains into pulse train devices with desired patterns, instruments, etc.

Inactive Publication Date: 2004-11-03
SAMSUNG ELECTRONICS CO LTD
View PDF1 Cites 11 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

A digital duty cycle correction circuit 600 that includes a DLL circuit may be smaller than a digital duty cycle correction circuit that includes an analog duty cycle correction circuit, but typically includes a DLL circuit because it uses the delay line of the DLL circuit

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Integrated circuit devices having improved duty cycle correction and methods of operating the same
  • Integrated circuit devices having improved duty cycle correction and methods of operating the same
  • Integrated circuit devices having improved duty cycle correction and methods of operating the same

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0033] Hereinafter, the present invention will be described more fully with reference to the accompanying drawings, in which preferred embodiments of the invention are shown. However, this invention may be embodied in many different forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and to the Those skilled in the art fully convey the scope of the present invention. It will be understood that when an element is referred to as being "coupled" or "connected" to another element, it can be directly coupled or connected to the other element or intervening elements may also be present. It will also be understood that when an element is referred to as being "directly coupled" or "directly connected" to another element, there are no intervening elements present. Like numbers refer to like elements throughout.

[0034] It will be understood that although the te...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

Digital duty cycle correction circuits are provided including a duty cycle detector circuit configured to generate first and second control values associated with a first internal clock signal and a second internal clock signal, respectively. A comparator circuit is also provided and is configured to compare the first control value to the second control value and provide a comparison result. A counter circuit is configured to perform an addition and / or a subtraction operation responsive to the comparison result to provide a digital code. A digital to analog converter is configured to generate third and fourth control values responsive to the digital code. Finally, a duty cycle corrector circuit is configured to receive first and second external clock signals and the first through fourth control values and generate the first and second internal clock signals having a corrected duty cycle. The first and second control values are received over a first path and the third and fourth control values are received over a second path, different from the first path. Related methods of operating duty cycle correction circuits are also provided.

Description

[0001] This application relates to and claims priority from Korean Patent Application No. 2003-19653 filed on March 28, 2003, the entire contents of which are incorporated by reference if necessary. technical field [0002] The present invention relates to an integrated circuit device and its operating method, more specifically, to an integrated circuit device with a duty cycle correction circuit and its operating method. Background technique [0003] Recently, the speed of integrated circuit memory devices, such as dynamic random access memories (DRAMs), has been increased to improve the performance of existing systems. However, growing demands for improved systems may require DRAM to be able to handle even more data at higher speeds. Accordingly, a synchronous dynamic random access memory (SDRAM) operating in synchronization with a system clock has been developed for high-speed operation, thereby significantly increasing the data transfer speed. [0004] There is a limit ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G11C8/00G11C29/00H03K5/156H03L7/00
CPCH03K5/1565G11C8/00
Inventor 李宇镇金圭现
Owner SAMSUNG ELECTRONICS CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products