Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method And Apparatus For Automatic Chromatography Of Thin-Layer Plates

a technology of automatic chromatography and thin-layer plates, applied in the direction of measuring devices, instruments, scientific instruments, etc., can solve the problems of poor reproducibility of the resulting chromatogram, difficult comparison of results on different plates and at different locations, and insufficiently careful adjustment of the inner atmosphere, so as to achieve better control of parameters

Inactive Publication Date: 2019-12-26
CAMAG CHEM ERZEUGNISSE & ADSORPTIONSTECHN
View PDF0 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The patent is about improving the way chromatography is done by using thin-layer plates. The new invention makes it possible to better control important factors that affect the development process, such as the properties of the separation layer and the composition of the inner atmosphere. This makes the chromatography faster, easier, and more accurate.

Problems solved by technology

A major shortcoming of this simple method is the poor reproducibility of the resulting chromatograms, making comparisons of results on different plates and at different locations difficult.
However, it is not sufficient to carefully adjust the inner atmosphere before the start of the chromatographic development, since it constantly changes in the course of the chromatographic development, in particular at the interface with the thin-layer plate due to the evaporation of the eluent.
However, this represents a complex infrastructure, with a fairly large volume, in which a chaotic and hardly controllable gas flow is generated.
Diffusion phenomena, however, are particularly slow, which may result in inhomogeneities in the composition of the inner atmosphere, particularly at the interface between the plate and the remainder of the volume.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method And Apparatus For Automatic Chromatography Of Thin-Layer Plates
  • Method And Apparatus For Automatic Chromatography Of Thin-Layer Plates
  • Method And Apparatus For Automatic Chromatography Of Thin-Layer Plates

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0025]The core of the invention is a method and an apparatus for automatic chromatography of thin-layer plates with a development chamber 1, in which a thin-layer plate D is sealed off and isolated from the external environment. For the good isolation and sealing-off of the thin-layer plate D, it is important that it is completely enclosed in the development chamber 1 with the entire separation layer and the carrier material. With the isolation of the thin-layer plate D in the development chamber 1, the chromatographic development can be carried out under very specific, adjustable, advantageous and above all accurately reproducible conditions, regardless of the external temperature, humidity and / or pressure. As a result, a much better reproducibility of the chromatographic developments is achieved, which allows cross-plate and cross-site comparisons.

[0026]The inventive method and the corresponding apparatus for the automatic chromatography of thin-layer plates will be described and ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A method for the automatic chromatography of thin-layer plates for thin-layer chromatography with a development chamber 1 in which a thin-layer plate D is completely enclosed, sealed-off and isolated from the external environment. In the development chamber, a front space containing an inner atmosphere is located on the front face of the separation layer of the thin-layer plate. The depth of the front space is about 2 mm and a maximum 3 mm. An inlet is provided at one end of the front space and an outlet is provided at the other end of the front space. During the chromatographic development, a stream of gas of particular composition determined by the user is created throughout the entire front space, the entire inner atmosphere being set in motion, without stagnant or stationary gas phase.

Description

[0001]The present invention relates to a method for automatic chromatography of thin-layer plates in the field of thin-layer chromatography according to the preamble of patent claim 1 and an apparatus for carrying out this method according to the preamble of patent claim 8.[0002]Thin-layer chromatography is a separation method for analyzing the composition of liquid samples consisting of two essential steps:[0003]1) The application of the sample to the separation layer of a thin-layer plate, usually a silica gel layer (the so-called stationary phase);[0004]2) The chromatographic development, wherein usually the lower end of the thin-layer plate is brought into contact with an eluent which migrates upwards at a certain speed in the separation layer by capillary forces (the so-called mobile phase).[0005]During the chromatographic development, the molecules contained in the sample are carried by the eluent through the separation layer. Due to their different chemical properties, differ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01N30/93
CPCG01N30/93G01N30/94G01N30/90G01N30/88G01N2030/8804G01N2030/945B01D15/42G01N30/38G01N2030/025
Inventor GUTMANN, BASTIANRICHERDT, NICOLASSCHRANZ, URS LUKASSTURGESS, MARK HOWELL
Owner CAMAG CHEM ERZEUGNISSE & ADSORPTIONSTECHN
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products