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3D semiconductor device and structure

a semiconductor and three-dimensional technology, applied in semiconductor devices, semiconductor/solid-state device details, electrical equipment, etc., can solve the problems of heat removal, deformation of the wire (interconnect) that connects the transistors together, and deformation of the transistors, etc., to achieve significant heat removal and power density reduction, and achieve the effect of reducing the cost of the devi

Active Publication Date: 2021-07-22
MONOLITHIC 3D
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The invention is about creating semiconductor devices that have multiple layers or are arranged in a three-dimensional manner. These devices can include transistors and interconnections, and can have a variety of functions, such as memory or RF circuits. The invention also describes methods for bonding different layers together using oxide or metal, and for creating a shielding layer to protect sensitive components. Overall, the invention allows for the creation of more complex and efficient semiconductor devices.

Problems solved by technology

However, wires (interconnects) that connect together transistors degrade in performance with “scaling”.
Regardless of the technique used to construct 3D stacked integrated circuits or chips, heat removal is a serious issue for this technology.
Removing the heat produced due to this power density is a significant challenge.
In addition, many heat producing regions in 3D stacked integrated circuits or chips have a high thermal resistance to the heat sink, and this makes heat removal even more difficult.

Method used

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  • 3D semiconductor device and structure
  • 3D semiconductor device and structure
  • 3D semiconductor device and structure

Examples

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Embodiment Construction

[0052]An embodiment of the invention is now described with reference to the drawing figures. Persons of ordinary skill in the art will appreciate that the description and figures illustrate rather than limit the invention and that in general the figures are not drawn to scale for clarity of presentation. Such skilled persons will also realize that many more embodiments are possible by applying the inventive principles contained herein and that such embodiments fall within the scope of the invention which is not to be limited except by the appended claims.

[0053]Some drawing figures may describe process flows for building devices. The process flows, which may be a sequence of steps for building a device, may have many structures, numerals and labels that may be common between two or more adjacent steps. In such cases, some labels, numerals and structures used for a certain step's figure may have been described in the previous steps' figures.

[0054]FIG. 1 illustrates a 3D integrated cir...

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Abstract

A 3D semiconductor device, the device including: a first level, where the first level includes a first layer, the first layer including first transistors, and where the first level includes a second layer, the second layer including first interconnections; a second level overlaying the first level, where the second level includes a third layer, the third layer including second transistors, and where the second level includes a fourth layer, the fourth layer including second interconnections; and a plurality of connection paths, where the plurality of connection paths provides connections from a plurality of the first transistors to a plurality of the second transistors, where the second level is bonded to the first level, where the bonded includes oxide to oxide bond regions, where the bonded includes metal to metal bond regions, where the third layer includes a crystalline layer, and where the second level includes a Radio Frequency (“RF”) circuit.

Description

BACKGROUND OF THE INVENTION1. Field of the Invention[0001]This application relates to the general field of Integrated Circuit (IC) devices and fabrication methods, and more particularly to multilayer or Three Dimensional Integrated Circuit (3D-IC) devices and fabrication methods.2. Discussion of Background Art[0002]Over the past 40 years, there has been a dramatic increase in functionality and performance of Integrated Circuits (ICs). This has largely been due to the phenomenon of “scaling”; i.e., component sizes within ICs have been reduced (“scaled”) with every successive generation of technology. There are two main classes of components in Complementary Metal Oxide Semiconductor (CMOS) ICs, namely transistors and wires. With “scaling”, transistor performance and density typically improve and this has contributed to the previously-mentioned increases in IC performance and functionality. However, wires (interconnects) that connect together transistors degrade in performance with “s...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): H01L21/48H01L23/498H01L23/34H01L27/02H01L21/8234H01L27/06H01L27/098H01L23/522H01L23/367H01L27/092H01L25/00H01L23/60H01L25/065
CPCH01L21/4871H01L23/3732H01L23/34H01L27/0207H01L27/0248H01L21/823487H01L27/0688H01L27/098H01L23/5226H01L23/3677H01L27/092H01L25/50H01L23/367H01L23/60H01L25/0657H01L23/49827H01L2924/0002H01L23/49838H01L27/0251H01L27/085H01L27/088H01L27/0922H01L2224/0401H01L2224/04042H01L2225/06527H01L2225/06541H01L2225/06589H01L25/16H10B12/00H01L23/373
Inventor OR-BACH, ZVICRONQUIST, BRIANSEKAR, DEEPAK
Owner MONOLITHIC 3D