Micrometer for measuring dimension of a conductive object

Abstract

A micrometer according to the present invention comprises: a frame of conductive material; an anvil of conductive material that is fixedly coupled to one end of the frame in an electrically insulated manner from the frame; a spindle of conductive material coupled to other end of the frame in such a way as to be moved back and forth along direction of the anvil in synchronization with rotation of a thimble while making electrical contact with the frame; and a controller configured to transmit a value for current gap between the anvil and the spindle to an external device as a measurement in case the anvil and the frame are electrically short-circuited. This configuration of the micrometer allows a measurement to be sent to the external device only in the case that a conductive object is necessarily mounted between the anvil and the spindle and electrically short-circuits them.

Description

BACKGROUNDField[0001]The present invention relates to a micrometer capable of precisely measuring a dimension of an object, and more particularly to a micrometer capable of transmitting information on a measured dimension to an external device.Description of the Related Art[0002]These days, many kinds of devices and appliances are used in daily life, work, leisure activities or medical practices etc. of people. Most of them perform the intended operations or functions based on electrical signal exchange among their components. Particularly, a large-sized equipment, for example, a vehicle, a communication device, a medical device or the like connects many kinds of cables to each other among a large number of components to enable electrical communication among its components.[0003]In order to easily connect many kinds of cables to connectors provided on a PCB or the like on which the components are mounted, the core wire 1 (the stripped wire) to constitute a cable is electrically conn...

AI Technical Summary

Benefits of technology

The present invention is a micrometer that makes it easier to measure conductive objects and confirm if they meet the required dimensions. It helps to prevent workers from intentionally avoiding measurements, which improves the quality control of the measured objects. Additionally, the micrometer reduces the amount of movement required for the worker, making the measurement process less tedious and more efficient.

Problems solved by technology

If the crimping is made weaker or stronger than the appropriate force (pressure), problems will occur.

In the former case, when the wire-connected terminal is installed in an apparatus such as a vehicle to undergo a high vibration, it may be detached from the wire because the crimping force connecting the wire to the terminal is weak.

And, if the vibration is continuously applied to the apparatus in the state where the joint is broken or the wire is cut off, the electrically-contacted state may become unstable or removed as the broken joint or the disconnected wire is separated.

However, the sample measuring works are troublesome for workers who have to deal with many kinds of wires.

If such a crimping work without actual measurement of a sample is done at the production field, it is impossible to find out the cause of a problem through post analysis using the POP system when the wires crimped thus cause a problem in an apparatus due to poor crimping.

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