Unlock instant, AI-driven research and patent intelligence for your innovation.

Large-area body surface organic volatile matter vacuum-sealing sampling chamber

A technology for organic volatiles and object surfaces, applied in sampling devices and other directions, can solve problems such as difficulty in analysis, and achieve the effects of avoiding changes in process parameters, eliminating wastage, and avoiding inconvenient sampling.

Inactive Publication Date: 2007-09-26
GRACE SEMICON MFG CORP
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, such an analysis method is a destructive analysis method. Objects with a large area such as walls cannot be placed in the sample chamber, and volatiles are analyzed on surfaces that are not easy to cut or are at an angle to the ground. will cause analytical difficulties

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Large-area body surface organic volatile matter vacuum-sealing sampling chamber
  • Large-area body surface organic volatile matter vacuum-sealing sampling chamber

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0027] The structural features and beneficial effects achieved by the present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0028] The present invention is a vacuum-sealed sampling chamber for organic volatiles on the surface of large-area objects. Figure 1 is a schematic structural view of the present invention. As shown in the figure, the structure of the vacuum-sealed sampling chamber for organic volatiles on the surface of large-area objects includes a sampling chamber shell 10, its lower end has an opening 12, the outer peripheral edge of the opening 12 extends outwards to form a flange 14, and the upper end of the sampling chamber housing 10 has a carrier gas inlet hole 16 and a carrier gas collection hole 18; Two sealing rings 20, 22 surrounding the flange 14 are arranged on the same side of the edge 14 and the opening 12, and the two sealing rings 20, 22 form a vacuum groove 24 with an open end, and the two se...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a device which by using negative pressure absorbing the sampling room on a object with large surface area performs the organic volatile matter survey. Its structure comprises a sampling room shell, above which an air entrance and a air collecting port is there. The lower end has a opening and the out cycle of the opening stretches outside forming a flange which has on it a vacuum slot and a vacuum air draining port communicating with each other.

Description

technical field [0001] The invention relates to a vacuum-sealed sampling chamber for organic volatiles, in particular to a vacuum-sealed sampling chamber for organic volatiles that can be used on the surface of large-area objects. Background technique [0002] According to Moore's law (Moor's law), the feature size of all electronic components is shrinking day by day, so any tiny impurities such as particles, organic matter and chemical pollution in the production process may cause the yield to decrease. In the deep sub-micron process, the degree of relative influence of impurities is becoming more and more serious, so the monitoring of impurities is an important issue in the clean rooms of various semiconductor factories, but tangible pollutants such as fine dust, toner on data files, etc. It can be controlled or removed by the clean room before entering the clean room, or it can be automatically processed by machinery such as a mechanical arm without pollution sources. How...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01N1/22
Inventor 丁祥金晏乃强
Owner GRACE SEMICON MFG CORP