Semiconductor laser measuring device parameter

A technology of parameter measurement and laser, which is applied in the direction of single semiconductor device testing, laser, laser parts, etc., can solve the problems of expensive testing equipment, inability to realize continuous testing, and single function, so as to facilitate large-scale testing applications and realize automatic The effect of continuous measurement

Inactive Publication Date: 2008-02-27
左昉 +3
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  • Abstract
  • Description
  • Claims
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AI Technical Summary

Problems solved by technology

The main feature of the system is the modular design, automatic or semi-automatic testing, which has a high degree of intelligence and high precision, but the testing equipment is expensive
Most domestic LD parameter testing system products cannot realize continuous testing, with single function and low work efficiency

Method used

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  • Semiconductor laser measuring device parameter
  • Semiconductor laser measuring device parameter

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Embodiment Construction

[0024] specific implementation plan

[0025] Figure 1 shows the block diagram of the high-precision and high-power fiber-coupled laser illumination device. The device of the present invention includes: a laser driver, a temperature controller, a refrigerator, a laser bracket, an automatic test motor, an integrating sphere, a monochromator, a preamplifier, a far-field test bracket, a far-field test motor, a motor driver, and a data acquisition control System, detectors 1, 2 and 3, computer and so on.

[0026] As shown in Figure 1, the main function of the laser driver is to turn on the laser according to the set laser driving current or voltage. In the embodiment of the present invention, the LDX3200 series laser driver of ILX Lightwave Company is used.

[0027] As shown in Figure 1, the laser temperature control part includes: temperature controller, refrigerator and temperature sensor. The main function of the temperature controller is to set the normal working temperature ...

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Abstract

This invention relates to a test device for parameters of semiconductor lasers including: a laser driver connected with the laser, a temperature control system connected with a laser frame, a motor for mounting cards automatically connected with the frame, an integrating sphere connected with the laser to be tested, a detector connected with the integrating sphere, the laser to be tested and a monochromator, a monochromator connected with the integrating sphere and a data collection controller, a far-field test motor connected with the detector, a preamplifier connected with the data collection controller, a data collection controller connected with a computer and a computer connected with the controller, which can test various parameters of semiconductor lasers.

Description

technical field [0001] The invention relates to a semiconductor laser parameter measuring device, which belongs to the field of semiconductor laser testing instruments. Background technique [0002] Semiconductor lasers have the advantages of small size, easy pumping, high efficiency, and direct modulation. With the continuous development of its technology in recent years, it has been widely used in pumping solid-state lasers, material processing, medical diagnosis and treatment, space communication, optical storage, etc. The performance parameters of semiconductor lasers are the basis and standard for evaluating the quality of lasers. At the same time, only by deeply understanding the various parameters and characteristics of lasers can we use lasers correctly and prolong their life as much as possible. [0003] Over the years, a lot of research work has been done to make semiconductor lasers used in the field of laser lighting. At present, Newport Company, Keithley Compa...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26H01S3/0941
Inventor 左昉苏美开胡仁喜张建勇
Owner 左昉
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