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Scanning wavelength apparatus

A wavelength meter and wavelength technology, which is applied in the field of scanning wavelength meter, can solve the problems such as inconvenient for users

Inactive Publication Date: 2008-07-09
索尔实验室公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] Performing standard measurements for insertion and reflection loss determination requires establishing insertion and reflection measurement methods for each test device and module, which may be inconvenient for the user

Method used

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  • Scanning wavelength apparatus
  • Scanning wavelength apparatus
  • Scanning wavelength apparatus

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Embodiment Construction

[0020] Referring to FIG. 1 , a tunable scanning laser 12 provides a scanning light output to a first coupler 14 which delivers the scanning light output to a panel connector and a second coupler 16 . The second coupler 16 sends the scanning light output to the photoelectric signal converter 17, and the converter converts the scanning light output into a sinusoidal periodic electrical signal. One form of an optical-to-electrical signal converter is shown in Figure 2, where the scanned light output from coupler 16 is delivered through polarizer 18 to a portion of highly birefringent fiber 20 (HiBi), which maintains the polarization state. Polarizer 18 is located at 45 degrees relative to the eigenmode or polarization axis of HiBi fiber 20 . At the other end of the HiBi fiber 20 is a polarizing beam splitter 22 , also located at 45 degrees relative to the polarization axis of the HiBi fiber 20 . HiBi fiber 20 in combination with input polarizer 18 and output polarizing beam spli...

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Abstract

A swept wavelength meter provides a real-time wavelength calibration scheme for a swept laser. The calibration scheme generates an electrical signal from a swept optical output of the swept laser that is cyclical with respect to the wavelength of the swept optical output over a defined range of wavelengths. The point on the electrical signal at any given time provides an accurate phase for the swept optical output at that point. The electrical signal in turn is calibrated by generating calibration references from the swept optical output using known absorption lines within the defined range of interest. The wavelength of the swept laser is calibrated as a function of a reference wavelength from the known absorption lines and the phase at the given point. Simultaneously forward and reflective measurements may be taken, with the forward measurement being used as a normalizing measurement for determining insertion and return loss automatically for a device under test.

Description

[0001] related application [0002] This application is a continuation-in-part of pending US Patent Application Serial No. 09 / 774,433, filed January 30,2001. technical field [0003] The invention relates to a scanning laser, in particular to a scanning wavelength instrument which provides synchronous wavelength calibration for tunable lasers and provides standard measurement for insertion and return loss measurement. Background technique [0004] A huge expansion in the complexity of fiber optic networks is evident when more and more components are commercially available. Many of these components are active, such as distributed feedback (DFB) lasers and erbium-doped fiber amplifiers (EDFAs). Other components are passive, such as multiplexers / demultiplexers and Fiber Bragg Gratings (FBGs). The most interesting properties of these passive components are their spectral transmission performance and / or reflectivity. [0005] To measure the spectral properties of passive optic...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J9/02G01M11/02G01J3/02G01J9/00H01S3/00
CPCG01J9/0246H01S3/0014G01J2003/2866G01J9/00
Inventor D·R·安德森
Owner 索尔实验室公司