Device and method for forming topological map and detecting topological structure
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- ZTE CORP
- Publication Date
- 2007-10-10
- Estimated Expiration
- Not applicable · inactive patent
Smart Images
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Abstract
Description
technical field
[0001] The invention relates to the field of communication technology, in particular to an automatic generation of a test topology diagram of a data product automatic test system and an automatic inspection device and method for a test topology structure. Background technique
[0002] With the rapid development of the data communication industry, a variety of new data communication technologies and emerging data communication equipment emerge in an endless stream, testing methods for data communication equipment testing and various special and general testing tools (also called test instruments, the same below) It has also been developed and applied in large numbers. However, with the continuous improvement of the test level and the deepening of the test level, the requirements for various aspects of the test tools are also continuously improved. In addition to meeting the basic needs of test functions, the test tools must also meet the needs of use efficienc...