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Device and method for forming topological map and detecting topological structure

A topology and inspection device technology, which is applied in the field of communication, can solve the problems of not caring about the equipment under test, incomplete topology information, judgment, etc., and achieve the effect of improving test efficiency, reducing the actual effect of test results and waste of working time

Inactive Publication Date: 2007-10-10
ZTE CORP
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AI Technical Summary

Problems solved by technology

[0005] The first problem: general test tools do not care about the information of the device under test, so the topology information in the test tool is incomplete
[0006] The second problem: since most of the GUI interfaces provided by different test tools are different, if a test environment has multiple types of test tools, test engineers have to perform different input operations on the same topology information
[0007] The third problem: After the test engineer completes the input of various topology information description parameters, the test engineer can only check the configuration of each test instrument one by one, and cannot directly judge whether the test topology information in the test system is consistent with the actual test topology. The situation is consistent, and the errors caused by the configuration of the test topology information are often discovered by the test engineer when the test results are analyzed after the test run is completed, which will inevitably lead to a waste of test time

Method used

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  • Device and method for forming topological map and detecting topological structure
  • Device and method for forming topological map and detecting topological structure
  • Device and method for forming topological map and detecting topological structure

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Embodiment Construction

[0018] A device and method for generating a topology map and checking a topology structure according to the present invention will be described in detail below in conjunction with the accompanying drawings.

[0019] Aiming at various problems in the existing testing technology in the case of multiple testing tools and multiple test cases, such as incomplete information, repeated input of information, and low efficiency of testing and inspection. How to describe the overall topology information of the test system, and generate a topology diagram based on the topology information; how to provide testers with a convenient means to directly modify the topology configuration according to the information reflected in the topology diagram, and to modify the topology according to the final topology information The topology structure of the test case is automatically checked, which is the problem faced by the present invention.

[0020] A method for generating a topology map and checki...

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Abstract

The method comprises: according to the information inputted from test engineer, dynamically generating topological structure graph; according to the topological structure graph, the test engineer can visually make check to decide if the topological structure information in the text system is accordance with the actual topological structure information. The test system can also automatically check the topology structure of the object to be tested to decide if it is accordance with the actual topological structure.

Description

technical field [0001] The invention relates to the field of communication technology, in particular to an automatic generation of a test topology diagram of a data product automatic test system and an automatic inspection device and method for a test topology structure. Background technique [0002] With the rapid development of the data communication industry, a variety of new data communication technologies and emerging data communication equipment emerge in an endless stream, testing methods for data communication equipment testing and various special and general testing tools (also called test instruments, the same below) It has also been developed and applied in large numbers. However, with the continuous improvement of the test level and the deepening of the test level, the requirements for various aspects of the test tools are also continuously improved. In addition to meeting the basic needs of test functions, the test tools must also meet the needs of use efficienc...

Claims

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Application Information

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IPC IPC(8): H04L12/26H04L12/24H04L29/02
Inventor 樊志强朱小龙杨奎许生海
Owner ZTE CORP
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