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A kind of testing method of hardware module

A technology of hardware modules and testing methods, applied in the direction of measuring electricity, electrical components, measuring devices, etc., can solve problems such as difficult code maintenance and transplantation, and achieve the effects of improving test efficiency, enhancing portability, and easy maintenance

Inactive Publication Date: 2011-11-30
ZTE CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Furthermore, in the test of a hardware module with a processor, the test code and the official code are included in a set of codes. During the test, the test is carried out by loading the test program. Introduce various errors, and it is not easy to maintain and transplant the code

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  • A kind of testing method of hardware module
  • A kind of testing method of hardware module
  • A kind of testing method of hardware module

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Embodiment Construction

[0029] The test system and method of the hardware module of the present invention increase the test package that integrates some functions of the equipment and meters to cooperate with the test of the hardware module, improve the test efficiency and the production efficiency of the hardware module, and reduce the test cost. The present invention will also formally The code and test code are separated, which enhances the portability of the code and makes it easier to maintain. The test system and method of the hardware module of the present invention will be further described in detail below by taking the radio frequency transceiver board (RFXX) as an example.

[0030] There are processor chips, analog circuits, radio frequency hardware circuits, etc. on the RFXX hardware board. The external hardware interface of the RFXX single board includes power on and off control logic, communication network port, debugging serial port, RF signal input and output ports, slot information, e...

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Abstract

The invention discloses a hardware module test system, which mainly comprises a hardware module, a test assembly, an instrument and a test backstage, wherein the test assembly is mainly used to aid in the internal hardware test, external interface test and hardware parameter test of the hardware module. The invention also discloses a hardware module test method, which employs the test assembly to aid in the test of hardware module and separate the test code from the formal code. With the aid of the test assembly integrating the partial function of the instrument in the hardware module test, the inventive hardware module test system and method can increase the test efficiency and the production efficiency of hardware modules and reduce the test cost. Additionally, based on the separation of the formal code from the test code, the invention can improve the code portability and facilitate the maintenance.

Description

technical field [0001] The invention relates to a testing technology of a hardware module, in particular to a testing system and method of a hardware module. Background technique [0002] When a variety of products appear, various hardware modules that are integral parts of the products will inevitably be constantly redesigned, upgraded and updated. With the emergence of various high-performance, high-density, small-volume, multi-functional, and serialized hardware modules, it marks that the hardware module has gradually developed from a simple hardware circuit design to a complex hardware circuit design. [0003] Complex hardware modules are not only reflected in multiple functions and high density, but also in complex external interfaces, various types of processor applications, and integration of various hardware circuits. The continuous development and application of hardware modules pose higher challenges for the comprehensive testing of hardware modules. [0004] At ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04B17/00G01R31/00G06F11/273H04Q1/20
Inventor 崔文会吴学德罗文胜王红展
Owner ZTE CORP