Circuit failure diagnosis method based on neural network
A neural network and circuit failure technology, applied in biological neural network models, electronic circuit testing, physical realization, etc., can solve problems such as large errors, time-consuming solutions, and increased penalty parameters, so as to get rid of penalty parameters, improve accuracy, and avoid The effect of the error problem
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[0014] Circuit fault diagnosis method of the present invention is as follows:
[0015] First, apply current or voltage excitation to the circuit to be tested, measure the measurable contact voltage, compare it with the normal situation to obtain the voltage increment, and obtain the relationship equation between the circuit component parameters and the excitation and response according to the circuit Kirchhoff's theorem (that is, the circuit fault characteristic equation) C i (x)=0(i=1,2,...,l), then the element parameter increment X=[x 1 ,...,x n ] T As an optimization variable, the constrained nonlinear discontinuous optimization method is used to solve the problem to obtain the component parameter increment, which is compared with the normal parameters to obtain the faulty component. The established constrained nonlinear discontinuous optimization problem is as follows:
[0016] min X Σ j ...
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