Regulating and calibrating method for linear array CCD scanning detection system

A scanning detection and calibration method technology, applied in image data processing, television, instruments, etc., can solve the problems of high labor intensity and low precision, and achieve the effect of good correction effect, simple algorithm and convenient realization.

Inactive Publication Date: 2009-02-11
BEIJING INFORMATION SCI & TECH UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The manual detection method has low precision and high labor intensity, and the area array CCD visual detection method has problems such as image splicing, while the line array CCD scanning vi

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  • Regulating and calibrating method for linear array CCD scanning detection system
  • Regulating and calibrating method for linear array CCD scanning detection system
  • Regulating and calibrating method for linear array CCD scanning detection system

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Embodiment Construction

[0019] Reference will now be made in detail to embodiments of the invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to like parts throughout. The embodiments are described below in order to explain the present invention by referring to the figures.

[0020] figure 1 It is a schematic diagram of the structure of the linear array CCD scanning visual inspection system. refer to figure 1 , The linear array CCD scanning visual inspection system includes a computer 1, a linear array CCD 2, an encoder 3, a conveyor belt 4, a roller 5, and a scanning area 6. The linear array CCD2 collects images in the scanning area 6, and the roller 5 drives the conveyor belt 4 forward, and at the same time drives the encoder 3 to send pulses to control the linear array CCD2 to collect images, and transmits them to the computer 1 for processing.

[0021] figure 2 Schematic diagram of the target structure. refer to figure 2 , the t...

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Abstract

The invention discloses an adjustment and calibration method for a linear-array CCD scanning and detecting system, which comprises the following steps of (1) arranging a plurality of equally-spaced vertical lines and two paralleled horizontal lines which are processed with high precision on a target; (2) arranging target pieces on production lines, adjusting a target plane and a detected plane on the same plane and enabling the target vertical lines to be in parallel with the forward direction of a conveyor belt; (3) gathering a target image, adjusting the array direction of a linear-array CCD camera to be perpendicular to the movement direction of the conveyor belt according to the image processing result, and also adjusting the target to be positioned on the front focal surface of an image-forming system; (4) gathering the target image after the adjustment, handling the image to obtain the position of each line of the target, and then evaluating a calibration parameter. The invention can be used for the on-site calibration of the linear-array CCD scanning and detecting system, and has the characteristics of fast adjustment and simple calibration.

Description

technical field [0001] The invention relates to an adjustment and calibration method of a linear array CCD scanning detection system, belongs to the field of photoelectric measurement, and is suitable for a linear array CCD scanning visual detection system. Background technique [0002] With the rapid development of photoelectric technology, visual inspection technology is more and more widely used in the field of industrial inspection with its characteristics of non-contact, full field of view, high precision and automation. Many industrial sites need to automatically detect the surface of industrial products, and analyze the images of industrial products after collecting them, so as to guide the production of products, such as grading, grading, and alarming. For example, rolled steel strips, printed and dyed textiles, printed printed matter, coated glass, ceramic tiles, etc., all need to detect the size or defect of the product online. The manual detection method has low ...

Claims

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Application Information

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IPC IPC(8): H04N17/00G06T7/00
Inventor 刘力双邓文怡吕乃光
Owner BEIJING INFORMATION SCI & TECH UNIV
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