Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Regulating and calibrating method for linear array CCD scanning detection system

A scanning detection and calibration method technology, applied in image data processing, television, instruments, etc., can solve the problems of high labor intensity and low precision, and achieve the effect of good correction effect, simple algorithm and convenient realization.

Inactive Publication Date: 2009-02-11
BEIJING INFORMATION SCI & TECH UNIV
View PDF0 Cites 35 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The manual detection method has low precision and high labor intensity, and the area array CCD visual detection method has problems such as image splicing, while the line array CCD scanning visual detection method can continuously complete the acquisition of the entire industrial product image, so Linear array CCD scanning visual inspection system has been more and more widely used

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Regulating and calibrating method for linear array CCD scanning detection system
  • Regulating and calibrating method for linear array CCD scanning detection system
  • Regulating and calibrating method for linear array CCD scanning detection system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0019] Reference will now be made in detail to embodiments of the invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to like parts throughout. The embodiments are described below in order to explain the present invention by referring to the figures.

[0020] figure 1 It is a schematic diagram of the structure of the linear array CCD scanning visual inspection system. refer to figure 1 , The linear array CCD scanning visual inspection system includes a computer 1, a linear array CCD 2, an encoder 3, a conveyor belt 4, a roller 5, and a scanning area 6. The linear array CCD2 collects images in the scanning area 6, and the roller 5 drives the conveyor belt 4 forward, and at the same time drives the encoder 3 to send pulses to control the linear array CCD2 to collect images, and transmits them to the computer 1 for processing.

[0021] figure 2 Schematic diagram of the target structure. refer to figure 2 , the t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an adjustment and calibration method for a linear-array CCD scanning and detecting system, which comprises the following steps of (1) arranging a plurality of equally-spaced vertical lines and two paralleled horizontal lines which are processed with high precision on a target; (2) arranging target pieces on production lines, adjusting a target plane and a detected plane on the same plane and enabling the target vertical lines to be in parallel with the forward direction of a conveyor belt; (3) gathering a target image, adjusting the array direction of a linear-array CCD camera to be perpendicular to the movement direction of the conveyor belt according to the image processing result, and also adjusting the target to be positioned on the front focal surface of an image-forming system; (4) gathering the target image after the adjustment, handling the image to obtain the position of each line of the target, and then evaluating a calibration parameter. The invention can be used for the on-site calibration of the linear-array CCD scanning and detecting system, and has the characteristics of fast adjustment and simple calibration.

Description

technical field [0001] The invention relates to an adjustment and calibration method of a linear array CCD scanning detection system, belongs to the field of photoelectric measurement, and is suitable for a linear array CCD scanning visual detection system. Background technique [0002] With the rapid development of photoelectric technology, visual inspection technology is more and more widely used in the field of industrial inspection with its characteristics of non-contact, full field of view, high precision and automation. Many industrial sites need to automatically detect the surface of industrial products, and analyze the images of industrial products after collecting them, so as to guide the production of products, such as grading, grading, and alarming. For example, rolled steel strips, printed and dyed textiles, printed printed matter, coated glass, ceramic tiles, etc., all need to detect the size or defect of the product online. The manual detection method has low ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H04N17/00G06T7/00
Inventor 刘力双邓文怡吕乃光
Owner BEIJING INFORMATION SCI & TECH UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com