Multi-reflecting time-of-flight mass spectrometer with orthogonal acceleration

Abstract

The disclosed apparatus includes a multi-reflecting time-of-flight mass spectrometer (MR-TOF MS) (11) comprising a pair of grid- free ion mirrors (12), a drift space (13), an orthogonal ion accelerator (14), an optional deflector (15), an ion detector (16), a set of periodic lenses (17), and an edge deflector (18). To improve the duty cycle of the ion injection at a low repetition rate dictated by a long flight in the MR-TOF MS, multiple measures may be taken. The incoming ion beam and the accelerator may be oriented substantially transverse to the ion path in the MR-TOF, while the initial velocity of the ion beam is compensated by tilting the accelerator and steering the beam for the same angle. To further improve the duty cycle of any multi-reflecting or multi-turn mass spectrometer, the beam may be time-compressed by modulating the axial ion velocity with an ion guide. The residence time of the ions in the accelerator may be improved by trapping the beam within an electrostatic trap. Apparatuses with a prolonged residence time in the accelerator provide improvements in both sensitivity and resolution.

Description

technical field [0001] The present invention relates generally to the field of mass spectrometry and, more particularly, to methods and apparatus involving multiple reflection time-of-flight mass spectrometers (MR-TOF MS), and to increasing the efficiency of orthogonal injection at low repetition rates. Method and apparatus for air ratios. Background technique [0002] Time-of-flight mass spectrometers (TOF MS) are becoming increasingly popular, both as stand-alone instruments and as part of mass spectrometer tandem configurations such as Q-TOF or TOF-TOF. They offer a unique combination of high speed, sensitivity, resolving power (resolution), and mass accuracy. The recently introduced multiple reflection time-of-flight (MR-TOF) mass spectrometer has shown 10 5 Substantial increase in resolution above (see "Multi-Turn Time-of-Flight Mass Spectrometers with Electrostatic Sectors" by Michisato Toyoda, Daisuke Okumura, Morio Ishihara and Itsu Katakuse entitled "Multi-Turn Ti...

AI Technical Summary

Problems solved by technology

[0004] However, as presented by ASMS (abstracts of ASMS 2005 and ASMS 2006 presented by B.N. Kozlov et al.), ion trap sources introduce at least two obvious problems: 1) ion scattering on the gas; 2) space charge effects Ion beam parameters

However, prior art ion sources do not provide sufficient duty cycles above a few percent, or have other disadvantages

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