Edge sensor and flaw detection apparatus

A sensor and defect detection technology, which is applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of influence, difficulty in clearly detecting the change of edge position, and difficult detection of edges, etc., and achieve the effect of great practical advantages

Active Publication Date: 2009-03-04
YAMATAKE HONEYWELL CO LTD
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Problems solved by technology

[0004] However, once there is a gap or crack at the edge of the vitreous body, it will be affected by the reflected light from the defect caused by the above-mentioned gap or crack inside the vitreous body
Therefore, it is difficult to correctly detect the edge from the above-mentioned Fresnel diffraction light quantity distribution pattern
Also, even if a line sensor is moved along the edge to detect the edge position of a glass body that has a chipped or cracked edge, it is difficult to unambiguously detect a change in edge position
Therefore, it is also difficult to identify the defect site in the vitreous body where the gap or crack occurs

Method used

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  • Edge sensor and flaw detection apparatus

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Embodiment Construction

[0041] Hereinafter, an edge sensor and a defect detection device using the edge sensor according to an embodiment of the present invention will be described with reference to the drawings.

[0042] figure 1 An edge sensor 10 that detects a specific position (for example, an edge position) of a transparent or translucent object A such as liquid crystal glass, and monitors the output of the edge sensor 10 while scanning the position detection target portion of the object A using the edge sensor 10 This is a general configuration diagram of a defect detection device for detecting the presence or absence of defects in the above-mentioned object A.

[0043] The edge sensor 10 includes the following components: an optical head 13, which separates a line sensor 11 formed by arranging a plurality of photosensitive units in a line at a predetermined interval from a light source 12 that projects monochromatic parallel light toward the line sensor 11 by a predetermined distance. distanc...

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Abstract

The invention provides an edge sensor and defect inspection device capable of reliably detecting breach, crack, or the like defects produced in transparent or semitransparent objects. When inventive edge sensor detects the edge position of transparent body or semitransparent body located in a parallel monochromatic light from the output of line type sensor formed by a plurality of light sensitive units arranged in a specified spacing, the edge sensor start to search the output of the line type sensor from free-space side, detects a first detection position where the luminous quantity drops to the first luminous quantity threshold in a luminous quantity distribution pattern produced by the edges of the object, and then detects a second detection position where the luminous quantity further drops to a second luminous quantity threshold value. So that the breach, crack, or the like defects are detected by variations of the first and second detection positions during scanning checkpoints along the edge.

Description

technical field [0001] The present invention relates to an edge sensor suitable for detecting chipping and cracking of, for example, an edge of a liquid crystal glass, and a defect inspection device using the edge sensor. Background technique [0002] The inventors of the present application have previously proposed a proposal focusing on the Fresnel diffraction of monochromatic parallel light at the edge of an object, and analyzing the light intensity distribution pattern detected by a line sensor using a plurality of photosensitive cells arranged at predetermined intervals. The position of the edge of the above-mentioned object can be detected with high precision at an accuracy equal to or greater than the arrangement pitch of photosensitive cells of the type sensor (refer to Japanese Patent No. 3858994). [0003] Furthermore, a technique has been proposed to detect the edge position with high precision by paying attention to the above-mentioned Fresnel diffraction for tra...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/958
CPCG01B11/16G01B11/24G01B11/30G01M5/0033G01N21/8806G01N33/386
Inventor 冈山喜彦
Owner YAMATAKE HONEYWELL CO LTD
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