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Method and device for generating a synthetic wavelength

A technology for synthesizing wavelengths and wavelengths, applied in measuring devices, optical devices, spectrometry/spectrophotometry/monochromators, etc., can solve problems such as stability limitations

Active Publication Date: 2009-08-19
LEICA GEOSYSTEMS AG
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, its stability is limited by the thermal expansion of the etalon length

Method used

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  • Method and device for generating a synthetic wavelength
  • Method and device for generating a synthetic wavelength
  • Method and device for generating a synthetic wavelength

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Embodiment Construction

[0047] Figure 1a -b shows the inventive idea of ​​shifting the frequency of the sidebands. The spectral position of the sideband frequencies can be changed or tuned by modulating a tunable primary light source capable of continuously shifting the first and / or second sideband frequencies. Taking upscan (upscan) as an example (downscan (downscan) is similar), the modulation frequency of the electro-absorption laser is increased from 10GHz to 20GHz, for example, Figure 1a shown. Next, the optical sidebands of the electroabsorption laser are taken from as the dominant frequency υ 0 The carrier frequency chirped away (chirped away), such as Figure 1b shown.

[0048] Figure 2a -b shows the modulation and current variation of two locked laser diodes. The modulation frequency of the electroabsorption laser is varied synchronously with the current applied to the distributed feedback laser so that the locking range of the distributed feedback laser is adapted to the sideband fre...

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Abstract

In a method for generating a synthetic wavelength, particularly for an in terferometric distance measuring setup, with a primary laser source defining a primary frequency U0 and at least a first sideband frequency U1 of the pr imary frequency U1, laser radiation with the first sideband frequency O1 and a corresponding first wavelength is provided wherein the first sideband fre quency U1 is continuously shifted, particularly by modulating the primary la ser source. The synthetic wavelength is generated by combining the first wav elength and a second wavelength which is defined by the primary laser source , particularly by superposition.

Description

technical field [0001] The present invention relates to a method for generating a synthetic wavelength as described in the preamble of claim 1, a method for measuring distance with a two-wavelength interferometry as described in claim 9, and a device for generating a synthetic wavelength as described in the preamble of claim 10 , and a dual-wavelength interferometry device for measuring absolute distances as claimed in claim 20. Background technique [0002] In many geodetic applications, various methods, devices and systems for measuring distance are employed. Typical requirements, depending on the particular conditions of the field, are accuracy or resolution below 1 cm. However, in specific applications the accuracy requirements can be even higher, such as in distance determination and industrial distance measurement, where in some cases it is necessary to measure long distances with sub-millimeter resolution. [0003] Like conventional interferometry, multi-wavelength ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B9/02
CPCH01S5/4068G01B9/02012H01S5/0656G01B9/02007G01B9/02G01B9/02003G01J3/10G01B2290/70
Inventor 塞巴斯蒂安·李·弗洛克伊斯·萨尔瓦德托马斯·延森马塞尔·罗纳
Owner LEICA GEOSYSTEMS AG
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