Method for testing magnetic recording medium and method for production of magnetic recording medium including testing step
A technology of magnetic recording medium and test head, applied in magnetic recording, data recording, measurement of magnetic variables, etc., can solve problems such as hindering accurate detection and reducing the reliability of magnetic recording medium.
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example 1-1
[0057] For the non-magnetic substrate, an amorphous glass substrate manufactured by HOYA Corporation was used. The glass substrate measured an outer diameter of 65 mm, an inner diameter of 25 mm, and a plate thickness of 1.270 mm.
[0058] The substrate was textured, thoroughly cleaned and dried, and set in a DC magnetron sputtering apparatus (manufactured by Anelva (Japan) Corporation and sold under the trade name "C3010"). The device is evacuated until 2 x 10 -7 Torr (2.7×10 -5Pa) vacuum, and by using a target of a Cr-Mn alloy (Cr: 70at%, Mn: 30at%), a Cr-Mn alloy (Cr: 70at%, Mn: 30at%) was laminated with a thickness of 6 nm on the substrate as Non-magnetic lining. By using a target made of a Co-Cr-Pt-B alloy (Co: 60at%, Cr: 20at%, Pt: 13at%, B: 7at%), Co-Cr-Pt-B with a film thickness of 17nm was formed The alloy layer was used as a magnetic layer, followed by laminating a protective film (carbon) with a thickness of 3 nm. The Ar pressure during film formation was set a...
example 1-2
[0062] The six magnetic recording media that have been observed to have output signals above the limit level are evaluated here. Here, the evaluation conditions of Example 1-1 were further tightened by setting the skid height to 0.19 microinches and the limit level to 40%. Set the bandpass filter from 400kHz to 3000kHz. These six magnetic recording media must have been found to have an output signal from the test head with the thermal element below the limit level. Signals emitted from the magnetic recording medium of Example 1-1 and exceeding the limit level must be considered to originate from ridges on the surface of the magnetic recording medium, and the magnitude of these ridges is considered to be within the range of the test head with thermally sensitive elements. follow level. This result shows that the signal from the ridge component of the test head with the thermal element can be reduced by increasing the lower limit of the bandpass filter from 100kHz to 400kHz, a...
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