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Phase-locked loop for reinforcing single-event transients (SET)

A single-event transient, phase-locked loop technology, applied in the direction of automatic power control, electrical components, etc., can solve the problems of output clock phase or frequency deviation, voltage-controlled oscillator stop oscillation, etc., to achieve accelerated locking, wide application range Effect

Inactive Publication Date: 2009-11-04
NAT UNIV OF DEFENSE TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, a single event transient (SET) event in a voltage-controlled oscillator (VCO) will directly cause a phase or frequency deviation of the output clock, and even cause the voltage-controlled oscillator (VCO) to stop oscillating.
How to reduce the influence of single event transient (SET) on phase-locked loop of radiation environment has become an unavoidable reliability problem

Method used

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  • Phase-locked loop for reinforcing single-event transients (SET)

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Embodiment Construction

[0012] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0013] figure 1 It is a structural block diagram of the radiation-hardened phase-locked loop involved in the present invention. The radiation hardened phase-locked loop includes two working modes: normal mode and compensation mode. When the phase-locked loop is working normally or in the locked state, the compensation circuit is in an idle state, and the compensation circuit is disconnected from the entire phase-locked loop, so the compensation circuit does not affect the normal operation of the loop, and the entire phase-locked loop is in normal mode . When a single event upset event occurs in the phase-locked loop, it will cause the control voltage V of the charge pump C An abnormal change occurs, beyond the normal operating range, the compensation circuit detects the abnormal voltage change and adjusts the V C is compensated, t...

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Abstract

The invention discloses a phase-locked loop for reinforcing single-event transients (SET), which comprises a basic phase-locked loop circuit and a symmetrical-control voltage-compensation radiation-hardening circuit. The phase-locked loop has no special requirements for the phase-locked loop circuit, and can be any phase-locked loop. The radiation-hardening circuit comprises an operational amplifier OP1, a pull-up PMOS pipe P1, an operational amplifier OP2 and a pull-down NMOS pipe N1, wherein the OP1 detects a minimum value of control voltage VC of a voltage-controlled oscillator (VCO), and controls the pull-up PMOS pipe P1 to be opened and closed so as to compensate the VC forward; and the OP2 detects a maximum value of the control voltage VC of the VCO, and controls the pull-down NMOS pipe N1 to be opened and closed so as to compensate the VC reversely. The phase-locked loop has the advantages of easing the radiation influence on each sensitive node in the phase-locked loop and speeding up locking the loop circuit, along with little cost and wide application range.

Description

technical field [0001] The invention mainly relates to the field of phase-locked loop design, in particular to an anti-radiation phase-locked loop. Background technique [0002] PLLs are widely used in different fields, typical applications are clock generation, synchronization, frequency multiplication, jitter and skew reduction, frequency synthesis, etc. As the core part of the system, once the phase-locked loop is out of order, it will cause the whole system to fail to work. The single event transient (Single Event Transient, SET) phenomenon is a typical radiation effect, which is caused by high-energy particles bombarding the sensitive nodes of the circuit caused by galactic cosmic rays, solar particle events, natural decay of transuranium materials or explosions of nuclear weapons in the outer atmosphere. The particle energy deposition after bombardment leads to impact ionization, and the ionized charges are transported and collected under the action of the electric fi...

Claims

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Application Information

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IPC IPC(8): H03L7/099
Inventor 张民选赵振宇陈吉华李俊丰陈怒兴李少青马卓方粮郭阳蒋仁杰白创黄冲郭斌
Owner NAT UNIV OF DEFENSE TECH
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