Material separating device

Abstract

The invention relates to a material separating device of a test device, which comprises a blockage arm, a first clamping jaw set, a first swing arm set, a second clamping jaw set, a second swing arm set, a first forward pushing block, a second forward pushing block, a third swing arm set, a down pressing seat and a power source, wherein the blockage arm is arranged at the front end of the material separating device and controls the entrance of a first element to be detected; the first clamping jaw set is arranged in back of the blockage arm and used for clamping the first element to be detected; the first swing arm set is arranged in back of the first clamping jaw set and used for controlling and clamping; the second clamping jaw set is arranged at the other side of the front end of the material separating device, positioned in back of the first clamping jaw set and used for clamping a second element to be detected; the second swing arm set is arranged in back of the second clamping jaw set; the first forward pushing block is arranged in back of the first swing arm set and connected with the second forward pushing block, and pushes the first clamping jaw set to move forward; the second forward pushing block controls the motion of the blockage arm; the third swing arm set is arranged in back of the first forward pushing block, and pushes the second and first forward pushing blocks forward; the down pressing seat is arranged above the first, second and third swing arm sets; and the power source is arranged above the down pressing seat and connected with the down pressing seat, and drives the down pressing seat. Because the material separating device has only one power source and the power source drives all elements to separate materials, the material separating speed canbe increased and the volume of a feeding mechanism can be reduced.

Description

technical field [0001] The invention relates to a material distributing device, in particular to a material distributing device for feeding a semiconductor device testing device, which has a single power source and uses a tube as a feeding mechanism. Background technique [0002] After the semiconductor components are packaged, the semiconductor components are usually tested to pick out defective products that were not detected before packaging, or to pick out products that were damaged during the packaging process, so as to ensure the quality of the products. Generally, the packaged semiconductor device is packed into a tube by a packaging manufacturer, and then sent to a testing factory for testing. In the test factory, the tube is first put into the feeding mechanism of the testing device, and the materials are distributed so that the semiconductor components can be separated into the testing device one by one, instead of entering the testing device all at once. [0003...

AI Technical Summary

Problems solved by technology

[0008] From this it can be seen that the above-mentioned existing material distribution device obviously still has inconvenience and defects in structure and use, and needs to be further improved urgently

In order to solve the above-mentioned problems, the relevant manufacturers have tried their best to find a solution, but no suitable design has been developed for a long time, and the general products do not have a suitable structure to solve the above-mentioned problems. Urgent problem

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