Testing device of display panel

Abstract

The invention relates to a testing device of a display panel, which is used for testing the line defect of the display panel. The testing device of the display panel comprises a carrying platform, a lower press plate, a conductive rubber block and a signal generator, wherein the carrying platform is provided with a containing groove used for containing the panel to be tested; the lower press plateis rotatablely arranged on the carrying platform and is provided with an observation window which corresponds to the containing groove; the conductive rubber block is arranged on the lower press plate; the signal generator is electrically connected with the conductive rubber block and outputs data signals to the conductive rubber block; and when in a testing state, the lower press plate is covered on the carrying platform, and the conductive rubber block is electrically connected with the panel to be tested. The testing device can effectively screen the panel which has the line defect causedby invalid line fault and leads the subsequent assembly to be continuously carried out, thus not only ensuring the product quality, but also reducing the production cost.

Description

technical field [0001] The present invention relates to a display panel testing device, in particular to a display panel testing device for testing liquid crystal display panel line defects. Background technique [0002] With the popularity and popularization of portable electronic devices, the display modules used in these devices have also been rapidly developed, and the output has also been increasing. Existing display modules include liquid crystal display (Liquid Crystal Display, LCD) modules, organic light-emitting display modules (OLED) and other types, and their basic structures include: display panels, driving circuits, backlight modules and other components. To test their respective functions. [0003] See figure 1 , figure 1 It is a partial schematic diagram of a conventional display panel 20 . The display panel 20 has a first substrate 21 on which a plurality of data lines 211 and a plurality of scan lines 231 are arranged. The interlaced area of ​​the data l...

AI Technical Summary

Problems solved by technology

But the test device 10 cannot be used for this type of detection, because the test switch element 2610 has been disconnected from the corresponding data line, and the data test signal cannot drive the corresponding data line

[0007] Therefore, the existing testing device cannot determine whether the line defect occurring before the assembly of the liquid crystal module is caused by the electrostatic breakdown of the test switch element or the scratch of the invalid area due to the limitation of the testing principle, so it can only be scrapped completely, thus causing a lot of problems. big waste

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