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Non-contact ultrasonic thermal-excitation infrared imaging nondestructive detection method and system

A technology of infrared thermal imaging and non-contact ultrasound, which is applied in the generation of ultrasonic/sonic/infrasonic waves, material defect testing, etc., can solve the problems of low detection success rate, easily damaged test pieces, and large noise, and achieve easy interpretation, The effect of low noise and high energy

Active Publication Date: 2010-05-26
杭州派肯科技有限公司
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Problems solved by technology

[0007] The present invention provides a non-destructive detection method and system of non-contact ultrasonic thermal excitation infrared thermal imaging to solve the problems in the above background technology. The existing detection method and system are easy to damage the test piece, the detection success rate is not high, and the noise is large and the energy is low. technical issues

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[0034] In order to better understand the shape, structure, and features of the present invention, preferred embodiments are listed below and described in detail with reference to the accompanying drawings.

[0035] In the non-contact ultrasonic thermal excitation infrared thermal imaging non-destructive testing system and testing method of the present invention, the inspection principle is that the ultrasonic controller 3 controls the ultrasonic transmitter 5 to emit ultrasonic waves with a preset frequency, and the ultrasonic gun of the ultrasonic transmitter 5 Air is used as the coupling medium between the head and the test piece 4 to implement non-contact coupling, and short ultrasonic pulses are applied to the surface of the test piece 4.

[0036] After the sound wave propagates to the test piece 4, if the test piece 4 has defects such as cracks, lack of fusion, delamination, etc., due to the friction, thermoelastic effect, and hysteresis effect at the defect site, the mechanica...

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Abstract

The invention relates to non-contact ultrasonic thermal-excitation infrared imaging nondestructive detection system used for detecting a test piece and comprising an ultrasonic launcher, an thermal infrared imager, a computer and an ultrasonic controller, wherein a test piece is arranged below or laterally below the ultrasonic launcher; the thermal infrared imager is arranged around the test piece and connected the computer; and the ultrasonic controller is connected with the ultrasonic launcher and the computer. The non-contact ultrasonic thermal-excitation infrared imaging nondestructive examination method comprises the following steps: (1) arranging a test piece to be detected below or laterally below an ultrasonic hammerhead of the ultrasonic launcher; setting needed parameters by the ultrasonic controller; (2) receiving a control signal of the ultrasonic controller and emitting sonic energy to the test piece by the ultrasonic launcher; (3) continuously observing and recording the temperature field variance of the test piece surface by the thermal infrared imager when enough ultrasonic energy is coupled in the test piece; and (4) utilizing the computer to collect data acquired by the thermal infrared imager to process and analyze the data and quantificationally diagnose the internal defects of the test piece.

Description

Technical field [0001] The present invention relates to the technical field of non-destructive flaw detection, in particular to a non-contact ultrasonic excited infrared imaging non-destructive detection method and system. Background technique [0002] Infrared thermal wave non-destructive testing technology is a non-destructive testing technology developed after the 1990s. This method is based on thermal wave theory, by actively applying a special mode of controllable thermal excitation to the detected object, and using an infrared thermal imager to continuously observe and record the temperature field changes on the surface of the object, and through modern computer technology and image information Processing technology carries out the detection, acquisition, data processing and analysis of time series heat wave signals to realize the quantitative diagnosis of internal defects or damages of objects. [0003] One of the key technologies of infrared thermal wave nondestructive tes...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N25/72G01N29/34
Inventor 陶宁王迅曾智冯立春张存林陈大鹏
Owner 杭州派肯科技有限公司
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