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Information processing system

An information processing system, memory technology, applied in information storage, memory system, digital memory information and other directions, can solve the problem that semiconductor devices cannot meet the guaranteed standard value and so on

Inactive Publication Date: 2010-07-07
FUJITSU LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Furthermore, semiconductor devices such as DRAMs have a limited lifetime to carry current and their functional characteristics degrade as the current carrying time increases
Eventually, semiconductor devices will become unable to meet guaranteed standard values ​​and reach the end of their lifetime

Method used

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Embodiment Construction

[0027] As mentioned above, DRAMs need to be replaced when they reach the end of their life. However, since the replacement occurs only after an error caused by data inconsistency is detected on the computer system, the reliability of the computer system may be temporarily reduced.

[0028] Hereinafter, embodiments of the present invention will be described with reference to the drawings.

[0029] figure 1 shows a lifetime evaluation device for a memory according to the present invention, figure 2 Is the functional block diagram of the life detection equipment.

[0030] Such as figure 1 As shown, the lifetime evaluation apparatus 1 is an information processing system (computer) including a memory module 14 (which functions as a main storage device) and a CPU 13 (which functions as a central arithmetic unit). The memory module 14 according to the present invention includes a DRAM 141 and an SPD (Serial Presence Detect) ROM 142 . The volatile memory in the memory module 14 ...

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Abstract

An information processing system includes a dynamic random access memory, a processor for information processing in cooperation with the dynamic access memory, and a built-in diagnosis module including a longevity evaluation device, the longevity evaluation device comprising, a timer for measuring an elapsed time after data is entered into a memory device, a read controller for reading the data from the memory device when the elapsed time reaches a predetermined time, and an evaluator for evaluating a longevity of the memory device based on an existence of an error in the data read by the read controller and the elapsed time.

Description

technical field [0001] An aspect of the embodiments discussed herein relates to information handling systems. Background technique [0002] DRAM (Dynamic Random Access Memory) is a volatile memory and has a structure that stores information in capacitors of memory cells. Therefore, after a period of time after data is written to the cell, the charge will leak and the information will be lost. Therefore, data written therein is refreshed at a fixed time. [0003] For example, the guaranteed data retention time for a 512Mbit DDR SDRAM is generally 64ms, and in order to retain data, it is necessary to perform a refresh operation for 32768 rows (ROW) within 64ms. [0004] Furthermore, semiconductor devices such as DRAMs have a limited lifetime to carry current and their functional characteristics degrade as the current carrying time increases. Eventually, semiconductor devices will become unable to meet guaranteed standard values ​​and reach the end of their lifetime. [000...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/07G11C11/4078
CPCG11C11/401G11C29/52G11C2211/4061G11C11/40615G11C29/023G11C11/406G11C29/50G11C2211/4068G11C29/50016G06F11/08G06F12/00
Inventor 春日和则目崎义宪
Owner FUJITSU LTD
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